ALBERT — All Library Books, journals and Electronic Records Telegrafenberg

Hits per page

hit 1 - 1 | 1 hit

Sorting

Unknown

Current crowding in two-dimensional black-phosphorus field-effect transistors (2016)

Q. Wang, X. Tao, L. Yang and Y. Gu

American Institute of Physics (AIP)

In: Applied Physics Letters

add to mindlist on the mindlist

Details

Publication Date: 2016-03-12

Description: By combining electrical measurements, scanning Kelvin probe microscopy, and numerical electrical simulations, we find significant current crowding in two-dimensional (2D) black phosphorus field-effect transistors. This current crowding can lead to localized Joule heating close to the metal contacts, and it is consistent with the features of the device failure observed in this study. Importantly, by considering both Schottky and resistive Ohmic contact models, we find that the commonly used transmission-line model, in general, significantly underestimates the extent of the current crowding. These findings, which are likely to be relevant in other 2D materials, suggest the need to take into account the current crowding effect in designing 2D devices.

Print ISSN: 0003-6951

Electronic ISSN: 1077-3118

Topics: Physics

Published by American Institute of Physics (AIP)

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

hit 1 - 1 | 1 hit