Publication Date:
2012-12-13
Description:
Author(s): M. P. Prange, M. P. Oxley, M. Varela, S. J. Pennycook, and S. T. Pantelides Aberration-corrected scanning transmission electron microscopy yields probe-position-dependent energy-loss near-edge structure (ELNES) measurements, potentially providing spatial mapping of the underlying electronic states. ELNES calculations, however, typically describe excitations by a plane wave ... [Phys. Rev. Lett. 109, 246101] Published Wed Dec 12, 2012
Keywords:
Condensed Matter: Structure, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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