ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
The present paper deals with SIMS and AES examination of the layer structure developing during the annealing of a Cu/Co/Si alloy. It was discovered from the spectra and Auger images that there is a significant local increase of the concentration of the alloying materials. A surface layer develops during heat treatment of the alloy sample. We prove the presence of CoSi clusters and the joint enrichment of Si and Co.
Additional Material:
13 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740010502
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