Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
60 (1989), S. 301-305
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Novel ac biasing and detection techniques have been developed to allow a scanning tunneling microscope (STM) to measure spatial variations in electric potential on metallic surfaces with sub-μV sensitivity. When implemented with a room-temperature STM operating with minimal electrical shielding and no vibration isolation, the voltage sensitivity was limited by the thermal (Johnson) noise of the tunneling resistance.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1140428
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