ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We report on the design and performance of an atomic force microscope which operates at temperatures down to 20 mK and in magnetic fields up to 9 T. The scan range at low temperatures is 4 μm×4 μm. The instrument features a piezoelectric linear motor for vertical coarse approach, and a horizontal sample translation stage with a 2 mm×2 mm range. A fiber interferometer is used to detect the force-sensing cantilever displacement. The performance demonstrated includes the ability to detect single atomic steps on a graphite surface at 4.2 K and the ability to locate and image nanometer scale electronic devices at millikelvin temperatures. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1149551
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