Publication Date:
2011-05-07
Description:
Author(s): Pascal Steiner, Enrico Gnecco, Franciszek Krok, Janusz Budzioch, Lukasz Walczak, Jerzy Konior, Marek Szymonski, and Ernst Meyer We report on high-resolution friction force microscopy on a stepped NaCl(001) surface in ultrahigh vacuum. The measurements were performed on single cleavage step edges. When blunt tips are used, friction is found to increase while scanning both up and down a step edge. With atomically sharp tips, f... [Phys. Rev. Lett. 106, 186104] Published Fri May 06, 2011
Keywords:
Condensed Matter: Structure, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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