ISSN:
0142-2421
Schlagwort(e):
Chemistry
;
Polymer and Materials Science
Quelle:
Wiley InterScience Backfile Collection 1832-2000
Thema:
Physik
Notizen:
Two chemical vapor deposited silicon carbide (SiC) mirrors were exposed to the 5 eV fast atomic oxygen environment in low Earth orbit on NASA's Long Duration Exposure Facility (LDEF) which remained in space for nearly 6 years. The samples were characterized using the techniques of x-ray photoelectron spectroscopy (XPS), ellipsometry, and reflectance measurements. The normal-incidence optical reflectance of the atomic-oxygen-exposed portion of one sample degraded considerably over the 60-160 nm span. The XPS results showed the presence of SiO2-like species, the thickness varying from 1 to 8 nm depending upon the location of the samples on the spacecraft. The XPS results are in good agreement with those from ellipsometry measurements.
Zusätzliches Material:
8 Ill.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1002/sia.740230206
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