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  • 1
    Electronic Resource
    Electronic Resource
    The development of in situ high-resolution electron microscopy (1988)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 44 (1988), S. 965-975 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Progress in introducing high-resolution electron microscopy at controlled elevated temperatures is described. Initial work involved the study of dynamic events in materials like cadmium telluride which can be heated to a sufficient degree by the imaging beam. However, for reproducible experiments the temperature must be carefully controlled and measured, and this involves a heating specimen holder. Results achieved recently this way on a variety of substances including CdTe, GaAs, Si, GaAs-Ti, GaAs-Ni, Si- Mo and Si-Ti, are reported. To derive information pertinent to bulk behavior both the manner of an in situ reaction and its kinetics should be compared with those for specimens prepared from macroscopic materials treated ex situ. For interface reactions in semiconductor materials it is found that events typical of the bulk can be recorded under high-resolution conditions in a large proportion of cases.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767388007445
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  • 2
    Electronic Resource
    Electronic Resource
    The Search for Top in UA2 (1989)
    Oxford, UK : Blackwell Publishing Ltd
    Annals of the New York Academy of Sciences 578 (1989), S. 0 
    Details
    ISSN: 1749-6632
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Natural Sciences in General
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1749-6632.1989.tb50593.x
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  • 3
    Electronic Resource
    Electronic Resource
    Crystallographic structure of CoPtCr/CrV thin films as revealed by cross-section TEM and x-ray pole-figure analysis and its relevance to magnetic properties : 37th Annual conference on magnetism and magnetic materials (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 5560-5562 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The crystallographic structure and coercive force of Co75Pt12Cr13/CrVx bilayer films sputter deposited on NiP/AlMg disks used in longitudinal magnetic recording were characterized as a function of varying V content from pure Cr through pure V. The coercive force of the CoPtCr peaked at an intermediate composition of the CrVx sublayer. The origin of this effect was elucidated by x-ray diffraction, x-ray pole-figure analysis, cross-section TEM, and elongated probe microdiffraction. The improving degree of epitaxy between the CoPtCr and the CrVx sublayer, the increasing fraction of Cr grains favoring the growth of (112¯0) Co grains with c axis in-plane, a narrowing of the mosaic spread in the orientation of Co grains, and an increasing size of Co regions with the 〈112¯0(approximately-greater-than) fiber axis orientation as CrVx composition approaches values between 80/20 and 50/50 Cr/V content account for the observed coercivity increase.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.353650
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  • 4
    Electronic Resource
    Electronic Resource
    Nature of the interlayer coupling in annealed Ni80Fe20/Ag multilayers : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 4762-4765 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using x-ray and polarized neutron (PNR) reflectivity, we have measured the structural and magnetic depth profiles of annealed Ni80Fe20 (20 A(ring))/Ag (40 A(ring)) multilayers. The x-ray data indicate that the interfaces are highly mixed. PNR measurements of the 335 °C annealed multilayer in small magnetic fields reveal a broad feature in the off-specular spin-flip scattering that is not present for the unannealed sample. The giant magnetoresistance is thus associated with antiferromagnetic correlations between micrometer-sized magnetic domains within the Ni80Fe20 layers. This spin ordering is consistent with a model in which weak dipolar forces lead to an antiparallel alignment of the domains across the Ag layers. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361664
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  • 5
    Electronic Resource
    Electronic Resource
    Grain growth and ordering kinetics in CoPt thin films : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 5330-5332 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Grain growth and ordering kinetics have been studied in a 10-nm-thick CoPt alloy film of equiatomic composition annealed in the temperature range 550–700 °C by quantifying the grain size, grain size distribution, ordered fraction and ordered domain size. The mean grain size of the as-deposited films is 5 nm and the film is fully face-centered cubic. Upon annealing in the temperature range 550–600 °C, the mean grain size reaches a stagnation limit of 27 nm and the grain size distribution is lognormal. Grain growth resumes beyond 600 °C and the mean grain size reaches as high as 55 nm at 700 °C. Ordering occurs by nucleation and growth of L10 ordered domains, with a mean size of 3 nm at 550 °C and 19 nm at 700 °C. The ordered fraction shows a dramatic increase from 1% to ∼28% between the two extremes of annealing temperature. The increase in the coercivity of the annealed films follows the increase in the ordered fraction more closely than the increase in grain size. The shape of the M–H loop shows evidence of coupling between the magnetically hard (ordered) and soft (disordered) regions. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361368
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  • 6
    Electronic Resource
    Electronic Resource
    Properties of epitaxial Ba-hexaferrite thin films on A-, R-, and C-plane oriented sapphire substrates : 37th Annual conference on magnetism and magnetic materials (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 6257-6259 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin films of Ba-hexaferrite of the magnetoplumbite structure have been prepared on sapphire substrates of orientation (112¯0), (11¯02), and (0001). Torque magnetometry indicates easy axes parallel, tilted off parallel, and perpendicular to the substrate for the A-, R-, and C-plane substrates. X-ray diffraction shows that this is due to epitaxy between the Ba-ferrite and sapphire. For each substrate orientation, the c axes of the Ba-hexaferrite and sapphire are parallel and the directions of close packing in the close-packed oxygen planes perpendicular to the c axes are parallel. Torque measurements are consistent with the combined effects of crystal and shape anisotropy. These results suggest that Ba-hexaferrite thin films with an easy axis at any angle with respect to the substrate can be prepared by appropriate choice of the sapphire substrate orientation, which may be of interest for microwave and other applications.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.354065
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  • 7
    Electronic Resource
    Electronic Resource
    Ba-ferrite thin-film media for high-density longitudinal recording (invited) : 38th Annual Conference on Magnetism and Magnetic Materials (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 5960-5965 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ba-ferrite is an attractive candidate for future high-density recording media because of its large coercivity, corrosion resistance, high hardness, and durability. In contrast to most recent work on Ba-ferrite thin film media, polycrystalline films with large in-plane remanence for longitudinal recording are emphasized. Films are prepared on a variety of substrates by on-axis sputtering at low temperatures from stoichiometric targets followed by a postdeposition anneal in a rapid thermal processor at ∼850 °C to induce crystallization. Structural and chemical properties have been investigated by force microscopy, Rutherford backscattering, and other means. Stoichiometric films have large 5000 A(ring) grains that are unsuitable for high-density recording. However, grain sizes as small as 200 A(ring) have been produced by doping with small amounts of Cr2O3 and other additives. Compositional changes also influence crystallite orientation. Exceptional durability has been observed on disks without overcoats, presumably due to a fine-scale texturing that occurs during crystallization. Coercivities are greater than 4000 Oe even in small grain films. The effect of grain size on coercivity and signal-to-noise ratio of several Ba-ferrite disks is discussed. It is argued that the grains are magnetically decoupled based on the magnetic properties of these films.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.356987
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  • 8
    Electronic Resource
    Electronic Resource
    Microstructural origin of giant magnetoresistance in a new sensor structure based on NiFe/Ag discontinuous multilayer thin films : 38th Annual Conference on Magnetism and Magnetic Materials (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 6382-6384 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The origin of giant magnetoresistance (GMR) in a new sensor structure incorporating discontinuous multilayers (DML) of NiFe thin films separated by Ag interlayers is elucidated by means of x-ray diffraction, x-ray reflectivity, and cross-section transmission electron microscopy. It is shown that the observed magnetoresistance, ∼4%–6% in fields on the order of 5–10 Oe at 25 °C, is associated with the breakup upon annealing of the initially dense, columnar superlattice structure into discontinuous multilayers of NiFe due to highly mobile Ag forming Ag bridges between the Ag layers. This observation supports a micromagnetic model for these structures that is based on the concept of initially large ferromagnetic domains in the as-deposited NiFe structure, exhibiting negligible GMR, breaking up into discontinuous layers, exhibiting an appreciable GMR, with antiferromagnetic ordering across the Ag interlayers.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.355357
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  • 9
    Electronic Resource
    Electronic Resource
    Low field giant magnetoresistance in discontinuous magnetic multilayers : 38th Annual Conference on Magnetism and Magnetic Materials (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 7058-7060 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Giant magnetoresistance of order 4%–6% has been observed in fields of 5–10 Oe at room temperature in annealed multilayers of Ni80Fe20/Ag prepared by magnetron sputtering. For a wide range of NiFe and Ag thicknesses, no giant magnetoresistance was observed in the unannealed films. We attribute the appearance of giant magnetoresistance to a magnetostatic interlayer interaction that promotes antiparallel order of the moments in adjacent layers fostered by a breakup of the NiFe layers. We discuss the effects of variations in the underlayers, spacer thickness, and the sputtering process on the magnetoresistance. Our results suggest that maximizing magnetoresistance and minimizing hysteresis require samples with continuous Ag layers that prevent contact between the NiFe layers and NiFe layers that are discontinuous but not too severly disrupted.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.356725
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  • 10
    Electronic Resource
    Electronic Resource
    Free-electron electrochromic modulation in crystalline LixWO3 (1986)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 60 (1986), S. 2735-2738 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The reflective and absorptive contributions to the optical modulation in sputter-deposited thin films of crystalline LixWO3 have been determined as a function of lithium concentration (0〈x〈0.5). The magnitude of the reflective response increases with increasing substrate temperature (Ts) during deposition for Ts≤466 °C. For Ts〉466 °C, the reflective component decreases. The lithium concentration dependence of the absorption coefficients supports the hypothesis that absorption in crystalline LixWO3 arises from free-electron scattering.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.337104
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