ISSN:
1573-0727
Keywords:
Bridging faults
;
fault models
;
fault simulation
;
test invalidation
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
Notes:
Abstract Dynamic effects in the detection of bridging faults in CMOS circuits are taken into account showing that a test vector designed to detect a bridging may be invalidated because of the increased propagation delay of the faulty signal. To overcome this problem, it is shown that a sequence of two test vectors 〈 T 0, T 1 〉, in which the second can detect a bridging fault as a steady error, can detect the fault independently of additional propagation delays if T0 initializes the faulty signal to a logic value different from the fault-free one produced by T 1. This technique can be conveniently used both in test generation and fault simulation. In addition, it is shown how any fault simulator able to deal with FCMOS circuits can be modified to evaluate the impact of test invalidation on the fault coverage of bridging faults. For any test vector, this can be done by checking the state of the circuit produced by the previous test vector.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00134730
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