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  • 1
    Publication Date: 2013-10-01
    Description: The first measurement of the electroweak production cross section of a Z boson with two jets (Zjj) in pp collisions at $ sqrt{s}=7 $ TeV is presented, based on a data sample recorded by the CMS experiment at the LHC with an integrated luminosity of 5 fb−1. The cross section is measured for the ℓℓjj (ℓ = e, μ) final state in the kinematic region m ℓℓ 〉 50 GeV, m jj 〉 120 GeV, transverse momenta $ p_{mathrm{T}}^{mathrm{j}}〉25 $ GeV and pseudorapidity |η j|
    Print ISSN: 1126-6708
    Electronic ISSN: 1029-8479
    Topics: Physics
    Published by Springer
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  • 2
    ISSN: 1063-7826
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract We report optical measurements (photoluminescence, Raman scattering, and infrared reflectance) of direct band gap and of optical phonon energies of BexZn1−x Se alloys grown by MBE on (001) GaAs substrates for a wide range of Be concentrations. The high band gap of BeSe (5.15 eV) suggests the possibility of using isoternary alloys for ultraviolet optoelectronic applications. BexZn1−x Se has the unique advantage that it can be lattice matched to Si at about x=0.5. We observed a strong linear shift of the BexZn1−x Se direct band gap to higher energies with increasing Be content (to 3.63 eV for x=0.34). Furthermore, optical phonon parameters for the entire range of BeSe content have been obtained. Finally, polarized infrared and Raman spectra revealed local atomic ordering (anti-clustering) effects in the group-II sublattice.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 1855-1858 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A practical technology for self-aligned Si-Zn diffusion into GaAs and AlGaAs has been developed. It is found that the use of a Si film alone for self-aligned Si-Zn diffusion is subject to serious problems of morphology degradation and doping contamination during the process of the Si diffusion. A procedure combining the use of a SiO2 film as an encapsulant with a sputtered Si film as source for Si diffusion and mask for Zn diffusion is investigated in detail. Optimum thicknesses of the Si and SiO2 films are determined to be 180 and 550 A(ring), respectively.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 855-860 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a study of the effect of the active cavity layer thickness variations on the operating characteristics of normally on low voltage high performance asymmetric Fabry–Perot modulators. For a modulator consisting of 25.5 periods of 100 A(ring) GaAs quantum wells confined by 45 A(ring) (GaAs/AlAs) short period superlattices with 5 pairs and 20.5 pairs of top and bottom quarter-wave stacks, respectively, and assuming only layer thickness variation caused by Ga flux nonuniformity, the shift of the Fabry–Perot mode wavelength with respect to the fractional change of GaAs thickness inside the active cavity is ∼6 times that of the quantum well heavy hole exciton. This affects the relative distance between the wavelengths of the quantum well exciton and the Fabry–Perot resonance, and hence the performance of the modulators. Also, the tolerable percentage change of the Fabry–Perot mode wavelength should be less than 0.13% in order that such modulator arrays have at least 10:1 contrast ratios at a fixed optimum operating wavelength. This defines the epitaxial growth tolerance and precision with which we can obtain a desired operating wavelength, and the uniformity requirement on the two-dimensional arrays of such kind of modulators.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 5524-5527 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The variation of the reflectivity and stopband width of disordered GaAs/(Al,Ga)As distributed Bragg reflectors (DBRs) is studied by thermal annealing of semiconductor DBRs and modeled by simulating interdiffusion of Al and Ga at the interfaces within the DBR. Undoped mirrors show stability in their reflectivity and stopband width for annealing durations of up to 24 h. Heavily Si-doped mirrors show strong degradation for annealing durations as short as 1 h. Using the model, excellent agreement with experimental results is found and interdiffusion coefficients can be estimated. The results show that important optical parameters are unchanged for short diffusion lengths, but drastically degrade for larger diffusion lengths. The results indicate the limits of thermal processing for device structures containing GaAs/(Al,Ga)As DBRs. The ability to accurately predict the effects of disordering on DBRs permits the proper design of vertical cavity structures containing DBRs, by specifically accounting for the effects of disordering.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 4479-4487 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We measured the increase in threshold currents due to lateral carrier diffusion in InGaAs/AlGaAs quantum-well ridge-waveguide laser diodes. The ridge stripes were fabricated by using both in situ monitored pure Cl2 reactive ion etching and selective wet etching to completely eliminate the spreading current in the conductive upper cladding layer while keeping the ridge sidewalls straight. After comparing the threshold data with a theoretical model, the ambipolar diffusion coefficient is found to be 22 cm2/s in the population-inverted InGaAs layer. This model is based on the calculated optical gain curve and the ambipolar carrier transport in the quantum-well and waveguiding layers. The dependence of carrier lifetime on the local carrier concentration is included in the calculation. Moreover, from another set of devices with the portions of the active layer outside the ridge stripes etched away, the surface recombination velocity is found to be around 1–2×105 cm/s.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 2189-2193 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present the results of luminescence studies for free-standing CdZnS/ZnS strained layer superlattices (SLSs). The band discontinuity is estimated by an analysis of the luminescence results in terms of a finite-potential well model. CdZnS/ZnS SLSs are grown by metal-organic vapor phase epitaxy at 350 °C on (100) GaAs. Photoluminescence (PL) measurements of the CdZnS/ZnS SLS at 1.4 K show intense, sharp excitonic emission in the blue-ultraviolet spectral region. With decreasing CdZnS well width, the PL peaks shift to higher energy. The quantum transition energies are calculated, including the effect of exciton binding energy and elastic strain. A free-standing SLS is assumed. In a Cd0.3Zn0.7S/ZnS SLS, the analysis of the data yields a zero-stress band discontinuity of ΔEc=461 meV and ΔEv=88 meV, which is in extremely good agreement with the data calculated from Harrison's model (465 and 84 meV, respectively). The band discontinuity over the entire Cd composition range is also estimated.
    Type of Medium: Electronic Resource
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  • 8
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The tunneling mechanism of electrons and holes to surface states from near-surface Al0.3Ga0.7As/GaAs quantum wells has been investigated by steady-state and time-resolved photoluminescence spectroscopy, near liquid-helium temperature, of the excitonic e1-hh1 transition in the well. The ensemble of the data, taken over a wide range of optical excitation levels, for various values of the tunneling-barrier thickness, and before and after passivation of the surface by hydrogen, allows a description both of the details of the tunneling mechanism and of the character and behavior of relevant surface states. The main results are summarized as follows: (i) steady-state tunneling is ambipolar, namely, separate for electrons and holes, rather than excitonic; (ii) Spicer's advanced unified defect model for an oxidized GaAs surface, antisite-As donors as dominating surface traps, provides an appropriate description of the state distribution at the interface between AlGaAs and its oxide; (iii) hole accumulation in surface states, resulting from the nominally different unipolar tunneling probability for the two carriers (and increasing with excitation level), generates a dipole electric field across the tunneling barrier, extending into the well; (iv) hydrogenation efficiently passivates electron trapping in surface states, but not hole tunneling and the consequent generation of a surface field by illumination; (v) the experimental findings agree with a model for ambipolar tunneling based on a self-consistent quantum-mechanical approach.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 3840-3845 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The phenomenon of layer disordering in CdZnSe/ZnSe and ZnSe/ZnS strained layer superlattices (SLSs) by Ge diffusion and the fabrication of ZnSe-based optical waveguides using the Ge-induced layer disordering in the superlattices has been studied. Both the as-grown sample and the sample annealed without a Ge layer showed several orders of well-resolved double crystal x-ray satellite peaks due to SLS periodic structure. However, the satellite peaks completely disappeared in the Ge-diffused sample, indicating that the SLS structure was disordered by the Ge diffusion and not caused by the annealing process. Photoluminescence (PL) measurements at 1.4 K of both the as-grown and the annealed samples without Ge diffusion show identical, sharp excitonic emission around 483 and 420 nm in CdZnSe/ZnSe SLS and ZnSe/ZnS SLS, respectively. After Ge diffusion, the PL peaks shift to higher energy, confirming the layer disordering of the SLS. The optically guided mode in the SLS guiding layer confined by the disordered alloy was confirmed, and a propagation loss α as low as 0.96 cm−1 was obtained.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 6244-6246 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new technology for self-aligned Si-Zn diffusion into GaAs and AlGaAs is described. In this technology, closed-tube Si diffusion is obtained from a sputtered SiNx film, and Zn diffusion self-aligned to the Si diffusion window is obtained by reusing the SiNx film as the mask. The key to a successful self-aligned Si-Zn diffusion is that the SiNx film is controlled to have a proper refractive index profile. © 1995 American Institute of Physics.
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