Publication Date:
2017-05-12
Description:
Author(s): Wolfgang Kreuzpaintner, Birgit Wiedemann, Jochen Stahn, Jean-François Moulin, Sina Mayr, Thomas Mairoser, Andreas Schmehl, Alexander Herrnberger, Panagiotis Korelis, Martin Haese, Jingfan Ye, Matthias Pomm, Peter Böni, and Jochen Mannhart Functional films and heterostructures with customizable electronic, magnetic, and optical properties are indispensable in science and applications, but we must know how their properties develop as we grow them. The authors offer proof of principle for the spin-sensitive technique of i n s i t u polarized neutron reflectometry, with acquisition time short enough to watch both structure and magnetization evolve during epitaxial growth of sputtered Fe films as one atomic layer after another is deposited. With modification, this neutron technique could be used with other deposition methods, too, such as molecular beam epitaxy or pulsed laser deposition. [Phys. Rev. Applied 7, 054004] Published Tue May 09, 2017
Electronic ISSN:
2331-7019
Topics:
Physics
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