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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 37 (1981), S. 439-440 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The polarization ratio is expressed by |cos 2θ|n, where 2θ is the angle between the incident and the diffracted rays. For a perfect uniblock single crystal, n is usually taken to be equal to 1. For an ideally imperfect crystal, n is taken to be 2. Any other value of n is attributed to the extent of mosaicity. Numerical computation of the polarization ratio for a perfect nonabsorbing single crystal of infinite lateral extension but finite thickness shows that n, instead of having the constant value of 1, may have any value between 1 and 2, depending on the thickness of the slab, the structure factor of the reflecting plane, the volume of the unit cell and the angle of scattering. The numerical computations are based on Zachariasen's theory of diffraction of X-rays by perfect crystals [Zachariasen (1945). Theory of X-ray Diffraction by Crystals. New York: John Wiley].
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 34 (1978), S. 284-288 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Optical transforms of the models of atomic configurations around edge and screw dislocations in f.c.c. and b.c.c. lattices as well as grain boundaries have been obtained with the help of a laser diffractometer. The models used were based on computer simulation studies of other workers. It has been observed that the intensity at the reciprocal lattice points splits into annular haloes or takes the 'figure of eight' shape in some cases. The directional dependence of the splitting has been compared with the existing theories. It has also been observed that with ordering of the dislocations at the grain boundaries, the diffraction pattern resembles that of a single dislocation.
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 65 (1994), S. 124-126 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A direct method of evaluating the scaling exponent H of a self-affine fractal surface from a single topographic image recorded by using scanning probe microscopy is presented. This method uses the fact that for these surfaces the root-mean-square roughness increases with length as LH. The method is applied to study the fractal nature of silver films of different thicknesses and it is observed that the variation in the scaling exponent H is in correlation with the surface roughness and the observed growth mode.
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 68 (1996), S. 1344-1346 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Lead–lanthanum–zirconate–titanate (PLZT) multilayer capacitors involving platinum bottom electrodes have been fabricated on a silicon nitride/silicon (SiN/Si) substrate system. Leakage current characteristics show strong dependence on the processing temperature of the bottom electrode. A drop in leakage current by five orders of magnitude has been observed for capacitor with platinum electrode deposited at room temperature. Scanning tunneling microscopy (STM) studies reveal significant differences in the microstructure of platinum films deposited at different substrate temperatures. Based on STM results, a correlation between the microstructure of the bottom electrode, space layer at PLZT/Pt interface, and the nucleation of PLZT has been suggested to explain this new observation. © 1996 American Institute of Physics.
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  • 5
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 8 (1975), S. 543-544 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The Fourier coefficient for a given order of a pure diffraction line profile is the product of the Fourier coefficients for the same order of its constituent profiles, such as particle size, strain, stacking and twinning faults, variable interlayer spacings, crystallite-size distribution etc. The Fourier coefficient for the crystallite-size effect is known to be AP(n) = (〈N〉−|n|), where is the average particle size and n is the order of the Fourier coefficient. According to Warren, in the presence of stacking and twinning faults, the Fourier coefficient derivative at zero order is a function of particle size and a linear combination of stacking and twinning fault probabilities. It has been shown here that Warren's calculation involves some approximations which are not needed. The Fourier coefficient for stacking and twinning faults as well as for variable interlayer spacing is of the type φn, where φ is a function of these fault parameters. The strain-dependent Fourier coefficient is known to be of the type exp ( − n2e2) where e is a function of r.m.s. strain and its derivatives. Combining all these, it has been shown that for all cases {{\rm d} \over {\rm d}n } \Bigg({A(n)\over A(0)}\Bigg) \Bigg|_{n=0} = - {1 \over \langle N \rangle}where A(n) is the Fourier coefficient for the original physical line profile uncorrected for strain and faults.
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  • 6
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 9 (1976), S. 352-352 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Certain errors in a previous publication by the present authors [Mitra & Mathur (1975), J. Appl. Cryst. 8, 543–544] on the interpretation of the initial slope of the Fourier-coefficient-against-order curve for X-ray diffraction line profiles have been pointed out and corrected. The effect of Cauchy strain distribution on determination of particle size has also been investigated.
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 3 (1984), S. 1105-1108 
    ISSN: 1573-4811
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
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  • 8
    Electronic Resource
    Electronic Resource
    Springer
    Plant and soil 125 (1990), S. 75-80 
    ISSN: 1573-5036
    Keywords: Macrophomina phaseolina ; quantitative determination ; sclerotia ; soil temperature ; survival
    Source: Springer Online Journal Archives 1860-2000
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition
    Notes: Abstract The quantitative determination of Macrophomina phaseolina population in an arid soil was carried out utilizing a selective medium. The population of the fungus increased under continuous monocropping with a susceptible host, but considerable reduction was recorded with crop rotation or a change in crop sequence. The effects of fungi, bacteria, actinomycetes, total microbial population, minimum and maximum soil temperature on the survival of M. phaseolina population were studied in the absence of a crop at different soil depths. Highest population and survival rates were recorded at 0–5 cm soil depth. Correlation and path coefficient analyses were carried out to determine the role of individual factors influencing M. phaseolina population. In winter months, low temperature and high actinomycete population were found to be the major factors governing the reduction of the population of M. phaseolina.
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  • 9
    ISSN: 1573-4811
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 28 (1993), S. 2315-2320 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Radial distribution analysis of X-ray intensities diffracted by natural coir fibre subjected to various thermal and mercerization treatments has been carried out. Interatomic distances, mean square displacements and interatomic coupling constants have been obtained from the radial distribution curves. As coir fibre finds its various applications in its natural form, its study has been carried out without disturbing the configuration of its cellulose-lignin complex during the treatments. Interatomic distances remain more or less the same during thermal and chemical treatments but the coupling constants and the mean square displacements experience changes, reflecting the changed mechanical behaviour of the fibre.
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