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  • 1
    Electronic Resource
    Electronic Resource
    Force microscope using a fiber-optic displacement sensor (1988)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 2337-2340 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A force microscope is described which uses a fiber-optic interferometer as the cantilever displacement sensor. Low thermal drift and reduced susceptibility to laser frequency variation are achieved due to the small (several micrometer) size of the interferometer cavity. A sensitivity of 1.7×10−4 A(ring)/(Hz)1/2 is observed for frequencies above 2 kHz. The drift rate of the sensor is on the order of 3 A(ring)/min. As an initial demonstration, laser-written magnetic domains in a thin film sample of TbFeCo were imaged.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1139958
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  • 2
    Electronic Resource
    Electronic Resource
    Magnetic force microscopy of thin Permalloy films (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 318-320 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have imaged naturally occurring domains in soft magnetic films using the force microscope. Classic closure structures were seen in both sputtered and plated Permalloy films. These structures were compared to optical Kerr micrographs of the same films, with generally good correspondence. The force microscope had sufficient sensitivity and resolution to observe magnetic details such as ripple structure and a Bloch line. Clear evidence of tip-induced wall motion was seen when the tip-to-sample separation was less than about 100 nm.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.101898
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  • 3
    Electronic Resource
    Electronic Resource
    Improved fiber-optic interferometer for atomic force microscopy (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 2588-2590 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A high-sensitivity fiber-optic displacement sensor for atomic force microscopy is described. The sensor is based on the optical interference occurring in the micron-sized cavity formed between the cleaved end of a single-mode optical fiber and the microscope cantilever. As a result of using a diode laser light source and all-fiber construction, the sensor is compact, mechanically robust, and exhibits good low-frequency noise behavior. Peak-to-peak noise in a dc to 1 kHz bandwidth is less than 0.1 A(ring). Images are presented demonstrating atomic resolution of graphite and magnetic force imaging of bits written on a magnetic disk.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.101987
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  • 4
    Electronic Resource
    Electronic Resource
    Data storage based on proximal probe techniques (invited) (abstract) : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 5644-5644 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Recently, there has been considerable interest in examining the feasibility of using proximal probe techniques as the basis for a data storage device. These techniques, derived from the scanning tunneling microscope (STM) and atomic force microscope (AFM), provide a potential pathway to reaching the ultrahigh densities needed in the decades ahead. While these techniques offer high areal density, a number of formidable technical challenges must be met, however, in order to produce a device with realistic data rate, error rate, and overall reliability. In this talk we will review some of the approaches that have been taken, including those based on the STM, the AFM, and near-field optics. We will focus on the efforts in our laboratory to demonstrate realistic data rates at reasonably high densities using thermomechanical writing with an AFM tip, and near-field recording with a solid immersion lens. The prospects for parallel tip arrays and issues of overall implementation will also be addressed. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.362268
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  • 5
    Electronic Resource
    Electronic Resource
    Single spin detection by magnetic resonance force microscopy (2004)
    [s.l.] : Macmillian Magazines Ltd.
    Nature 430 (2004), S. 329-332 
    Details
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] Magnetic resonance imaging (MRI) is well known as a powerful technique for visualizing subsurface structures with three-dimensional spatial resolution. Pushing the resolution below 1 µm remains a major challenge, however, owing to the sensitivity limitations of conventional ...
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1038/nature02658
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  • 6
    Electronic Resource
    Electronic Resource
    Thermomechanical data storage using a fiber optic stylus (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 64 (1994), S. 267-269 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have developed a simple and fast surface modification technique for possible data storage applications. Writing is accomplished by heating the metallized tip of a tapered optical fiber with microsecond laser pulses. The heated tip, which is in contact with a polycarbonate substrate, creates a nanoindentation. Deflections of this same tip are used to detect the written marks, as in atomic force microscopy. The marks have sharp edges with 10%–90% transition widths of 0.2 μm, and have been written with laser pulses as short as 5 μs at repetition rates of 50 kHz. Readback has been performed over 300 kHz on a spinning sample. Substantial improvements in mechanical response and wear properties are seen compared to micromachined cantilevers.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.111176
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  • 7
    Electronic Resource
    Electronic Resource
    High-speed scanning tunneling microscopy: Principles and applications (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 161-168 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A fast scanning tunneling microscope (STM) for scanning micron-sized areas of atomically rough surfaces has been developed. The response time of the feedback loop controlling the tip-sample spacing is roughly 5 μs, and the maximum scan velocity is 1 mm/s. The instrument uses fast electronics and a novel mechanical design to achieve the high bandwidth. The high bandwidth makes the STM capable of nearly real-time panning and zooming, allowing for rapid searches over the surface of the sample. The instrument has been used in air to study wear of atomic layers, and also to perform nanowriting while scanning. In the case of the wear study, it was found that step edges not only can retreat during wear, but can also advance.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.355877
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  • 8
    Electronic Resource
    Electronic Resource
    Magnetic force microscopy with batch-fabricated force sensors : 35th annual conference on magnetism and magnetic materials (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 5883-5885 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In this paper the properties of force sensors suitable for magnetic force microscopy (MFM) made by coating silicon microcantilevers with various thin magnetic films are analyzed. These MFM force sensors are batch fabricated and their magnetic properties controlled by choosing appropriate coatings. Theoretical calculations show that thin-film MFM tips have a significantly reduced stray field, a good signal-to-noise ratio, and yield improved resolution when compared to etched wire tips. The sample perturbation due to the tip stray field is small, allowing the imaging of low-coercivity samples such as Permalloy.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.347856
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  • 9
    Electronic Resource
    Electronic Resource
    Magnetic force microscopy: General principles and application to longitudinal recording media (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 1169-1183 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This paper discusses the principles of magnetic force microscopy (MFM) and its application to magnetic recording studies. We use the ac detection method which senses the force gradient acting on a small magnetic tip due to fields emanating from the domain structure in the sample. Tip fabrication procedures are described for two types of magnetic tips: etched tungsten wires with a sputter-deposited magnetic coating and etched nickel wires. The etched nickel wires are shown to have an apex radius on the order of 30 nm and a taper half-angle of approximately 3°. Lorentz-mode transmission electron microscopy of the nickel tips reveals that the final 20 μm is essentially single domain with magnetization approximately parallel with the tip axis. Images of written bit transitions are presented for several types of magnetic media, including CoPtCr, CoSm, and CoCr thin films, as well as γ-Fe2O3 particulate media. In general, the written magnetization patterns are seen with high contrast and with resolution better than 100 nm. A number of magnetic recording applications are discussed, including the investigation of overwrite behavior and the writing characteristics in CoSm media at high data density. Computer calculations were performed to simulate the MFM response to written magnetic transitions. By including the extended geometry of the tip, the nonparallel orientation of the cantilever, and the finite width of the magnetic transitions, good agreement with experiment was obtained. The model calculations correctly predict the experimentally observed change in image contrast that occurs as a function of tip orientation. Computer calculations showing the dependence of resolution on tip geometry are also presented.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.346713
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  • 10
    Electronic Resource
    Electronic Resource
    Magnetic force microscopy of recording media (abstract) (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 5953-5953 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic force microscopy (MFM) is an imaging technique which is particularly well suited to studying magnetization patterns and other issues in magnetic recording physics. The technique provides high magnetic contrast, submicrometer resolution, requires a minimum of sample preparation, and can be used with both soft and hard magnetic materials. We have developed a MFM designed around a novel optical-fiber interferometer incorporating a laser diode, and have used it to study a variety of thin films of recording media. We have imaged transitions written with a recording head in both CoPtCr, a longitudinal medium in which the magnetization lies in plane, and CoCr, a perpendicular medium. The MFM revealed fine structure such as intrinsic media noise on virgin media, detail within magnetic transitions, and side-writing effects. We have also used the MFM to study the erase band created during overwrite under various conditions. In films of SmCo, a novel thin-film medium, the MFM revealed that there exists a minimum spacing between transitions below which the magnetization pattern cannot be sustained. In order to improve lateral imaging resolution, we have fabricated tips by sputter coating nonmagnetic tungsten tips with 50 nm of CoPtCr. Using these tips we have achieved resolution well under 100 nm.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.346024
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