Electronic Resource
Amsterdam
:
Elsevier
International Journal of Radiation Applications & Instrumentation. Part D,
12 (1986), S. 245-248
ISSN:
1359-0189
Keywords:
Annealing
;
Apatite
;
Bulk etching
;
Fission track
;
Length distributions
;
Monte Carlo
;
Range
;
Scanning bias
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Type of Medium:
Electronic Resource
URL:
http://linkinghub.elsevier.com/retrieve/pii/1359-0189(86)90580-7
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