Publikationsdatum:
2013-10-11
Beschreibung:
Resonant X-ray reflectivity can combine the layer sensitivity of the reflectivity technique with the chemical composition sensitivity of the absorption technique. The idea is demonstrated through a depth profile study of the chemical composition of a multi-element thin-film system at the soft X-ray spectral range near the boronKabsorption edge. The composition profile of a multi-element low-contrast (
Print ISSN:
0021-8898
Digitale ISSN:
1600-5767
Thema:
Geologie und Paläontologie
,
Physik
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