ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
This article presents and compares two differential methods for measuring the complex permittivity of dielectric materials: In the first method, two measuring cells built as coaxial transmission lines of identical cross section and terminations but different lengths are filled with a sample of the dielectric material. The complex dielectric permittivity is determined from the scattering parameter measurements and the length difference between the two cells, neglecting the resistive losses due to the cells. The second method is a double-differential one: Repeating measurements on the same cells empty, no other knowledge or limiting assumption is required. © 2002 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1494870
Permalink