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  • 1
    Electronic Resource
    Electronic Resource
    Magnetic properties and crystal texture of Co alloy thin films prepared on double bias Cr : 37th Annual conference on magnetism and magnetic materials (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 6677-6679 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A double layer Cr film structure has been prepared by sputter depositing Cr on single crystal Si substrates first without substrate bias and then with various substrate bias voltages. Without substrate bias, Cr{200} texture grows on Si at room temperature; thus the first Cr layer acts like a seed Cr layer with the {200} texture, and the second Cr layer, prepared with substrate bias, tends to replicate the {200} texture epitaxially. CoCrTa and CoNiCr films prepared on these double Cr underlayers, therefore, tend to have a {112¯0} texture with their c-axes oriented in the plane of the film. At the same time, the bias sputtering of the second Cr layer increases the coercivity of the subsequently deposited magnetic films significantly. Comparison studies of δM curves show that the use of the double Cr underlayers reduces the intergranular exchange interactions. The films prepared on the Si substrates have been compared with the films prepared on canasite and glass substrates. It has also been found that the magnetic properties are similar for films on canasite and on glass.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.352499
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  • 2
    Electronic Resource
    Electronic Resource
    Search for high moment soft magnetic materials: FeZrN (abstract) : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 5011-5011 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: FeN materials exhibiting high moment, low coercivity and small magnetostriction have previously been reported. Zr has been known to reduce the magnetostriction in other Fe alloys. The criteria for an ideal recording head pole material as well as shields for magnetroresistive sensors include high moment, low coercivity, high permeability, and zero magnetostriction. We present here the properties of half micrometer thick rf sputtered FeZrN films on glass coupons. The films were deposited at a pressure of 3 mTorr using a Perkin–Elmer sputtering system. The target was composed of Fe with Zr chips covering approximately 2% of the surface area. The properties were measured as a function of the N2 partial pressure. The saturation magnetization of the as-sputtered films was approximately 20 kG. The easy axis and the hard axis coercivities show minima at approximately 7%–10% N2 partial pressure of approximately 1.8 and 0.6 G, respectively. The magnetic anisotropy is approximately 5 G yielding a dc permeability of approximately 4000 along the hard axis. X-ray data reveal a systematic change in the ratio of α-Fe and γ-Fe4N; the amount of the γ-Fe4N phase increases with increasing N2 flow rate. The magnetostriction increases with increasing N2 content crossing zero at approximately 6%. The grain size as probed by atomic force microscopy is an increasing function of the N2 partial pressure, from a few nm for a N2 partial pressure of 5% to as large as 50 nm for a N2 partial pressure of 15%. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361557
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  • 3
    Electronic Resource
    Electronic Resource
    Media for 10 Gb/in.2 hard disk storage: Issues and status (invited) : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 4496-4501 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Future 10 Gb/in.2 recording densities represent submicron trackwidths and sub-100 nm bit lengths. This requires extremely small magnetic switching units and very high coercivities of the media to satisfy the signal-to-noise ratio requirements. At the same time the question of magnetic thermal stability and the lack of transducers capable of performing at these densities makes it difficult to evaluate media. An uncoupled, highly uniform magnetic grain size of about 10 nm is a compromise toward maintaining an adequately low media noise and yet maintaining magnetic stability. Here we discuss current media construction, the detrimental role of substrate roughness, the role of new media structures and alloys on microstructure and magnetic properties as well as techniques for evaluating media performance prior to the availability of the required playback heads. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361876
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  • 4
    Electronic Resource
    Electronic Resource
    Bismuth substituted iron garnet thin films deposited on silicon by laser ablation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 2128-2132 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin films of bismuth substituted iron garnet are fabricated on silicon (100) substrates using the pulsed laser deposition technique. There is a narrow temperature range in which good polycrystalline garnet films can be grown on silicon; it must be higher than 575 °C for the films to crystallize and lower than 700 °C to avoid chemical reaction between the silicon substrate and the deposited materials. Film microstructure and magnetic properties are compared for films grown at different growth conditions and annealing procedures. The films heated during deposition are smooth and dense in contrast to the post-annealed films, which are characterized by clusters of many smaller grains separated by large cracks and a very small coercivity. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358789
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  • 5
    Electronic Resource
    Electronic Resource
    Formation of crystallographic texture in rf sputter-deposited Cr thin films (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 7311-7316 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Although it is well known that Cr underlayers sputter deposited on glass or NiP/Al substrates have either the (002) or (110) textures, the mechanism of the formation of the crystallographic textures is not clear. A model is proposed for the formation of the crystallographic texture of sputter-deposited Cr thin films. A systematic set of experiments has been carried out to test the model. It was found that the (110) texture, which is usually found in Cr thin films deposited on substrates without preheating, can form at elevated temperatures (250 °C) when deposited at low Ar pressure or by applying substrate bias. The initial stage of the texture formation was also investigated by using very thin Cr films. It was found that the (002) texture can be initiated directly on the substrate surface, while the (110) texture appears not to form directly on substrate surface, but rather as a result of film growth. The proposed model is consistent with the experimental results. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358019
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  • 6
    Electronic Resource
    Electronic Resource
    Substrate bias effects on composition and coercivity of CoCrTa/Cr thin films on canasite and glass : 37th Annual conference on magnetism and magnetic materials (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 5557-5559 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: CoCrTa/Cr thin films were prepared by rf diode sputtering onto canasite and glass substrates at various bias voltages from two targets of different compositions (Co82.8Cr14.6Ta2.6 and Co86Cr12Ta2). While Auger depth profile analysis indicates that there is some broadening at the CoCrTa-Cr interface, x-ray fluorescence spectroscopy reveals that changes in alloy composition due to the resputtering processes are even more prominent. For both targets, as the substrate bias increases the Co content in the films declines, and the magnetization decreases. The maximum film coercivity appears to correlate to the final film composition. By investigating the results from both targets, it is concluded that the coercivity reaches a maximum when the film composition is in the neighborhood of Co84Cr13Ta3. Thus, to optimize the coercivity different bias voltages are required for each target. Excessive substrate bias, however, leads to films with low magnetization and coercivity.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.353649
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  • 7
    Electronic Resource
    Electronic Resource
    FeAl underlayers for CoCrPt thin film longitudinal media : The 41st annual conference on magnetism and magnetic materials (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 4366-4368 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: B2 ordered FeAl films with a small, uniform grain size have been produced by rf diode sputter deposition on glass substrates. CoCrPt films grown on FeAl underlayers were found to have the (101¯0) lamellar texture. The in-plane coercivities (Hc) of the CoCrPt/FeAl films are comparable to those of the CoCrPt/Cr films and they can be further improved by inserting a thin Cr intermediate layer between the CoCrPt and the FeAl layers. By employing a MgO seed layer or a (002) textured Cr seed layer, (001) textured FeAl can be obtained. However, the (001) FeAl underlayer only induces a weak (112¯0) textured CoCrPt. Thus no improvement in Hc over those produced on unseeded FeAl underlayers was observed. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.364824
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  • 8
    Electronic Resource
    Electronic Resource
    AFM structure and media noise of SmCo/Cr thin films and hard disks : 38th Annual Conference on Magnetism and Magnetic Materials (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 6132-6134 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Longitudinal media for ultrahigh density recording require a high coercivity and a low medium noise. While the coercivity is controlled mainly by the chemical composition of the alloy, the medium noise is influenced significantly by the microstructure of the underlayer. We used atomic force microscopy (AFM) to study the microstructure of Cr underlayers and SmCo magnetic films. The AFM study shows that the Cr grains have elongated "rice''-like granular features whereas the SmCo grains without an underlayer appear circular with nonuniform grain size. The Cr underlayer grows as well isolated columns with voids. When thin SmCo films (〈20 nm) were deposited on the thin Cr (〈35 nm) underlayers the SmCo grains were found to replicate the isolated, columnar structure of the underlayer. The intergranular exchange interaction and the recording media noise of SmCo/Cr thin films decreased with a decreasing thickness of the Cr underlayer. The medium noise of high coercivity SmCo/Cr hard disks prepared on thin Cr underlayers remained almost flat with no supralinear increase when tested up to 2760 fc/mm (70 kfci).
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.355432
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  • 9
    Electronic Resource
    Electronic Resource
    Materials and processing aspects of CoCrTa/Cr longitudinal recording media. I. Processing and magnetic properties (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 8167-8173 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In this study, we correlate various processing conditions with the magnetic properties of CoCrTa/Cr films by varying the substrate preheating, the substrate bias, and the composition of the magnetic target. High Hc CoCrTa/Cr films with thin Cr underlayers were produced by either preheating the substrate or by rf bias sputtering. We found that the sputtering temperature of the magnetic layer plays a far more important role in reducing intergranular exchange coupling and increasing Hc than does the CoCrTa/Cr crystallographic texture. The optimum condition for preparing high Hc films depends on the magnetic target composition. Even though the crystallographic texture does not control Hc, it does have an effect on the ΔM curve which is related to the noise properties of CoCrTa/Cr media. ΔM measurements indicate that {11¯01}Co /{110}Cr textured films may have slightly better noise properties than the films with {112¯0}Co /{200}Cr texture with similar Hc. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.357868
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  • 10
    Electronic Resource
    Electronic Resource
    Texture evolution in CoCrPtTa/Cr/NiAl magnetic recording media (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 85 (1999), S. 4295-4297 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Crystallographic textures in a CoCrPtTa/Cr/NiAl multilayer magnetic recording media were studied by electron diffraction. It was found that texture quality evolves through the thickness of the films. A large improvement of texture quality was discovered at the interface of the Cr and NiAl layers. Surprisingly, there remains a portion of randomly oriented grains in the CoCrPtTa layer, in addition to the anticipated grains of [101¯0] texture. The texture quality of the CoCrPtTa layer remains similar to that of the underlying Cr layer. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.370347
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