Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
85 (1999), S. 5142-5144
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Rotational transverse magnetometry (RTM) is used to measure the anisotropy field of magnetic thin films. Magnetization reversal during rotation of a two-dimensional isotropic sample in an applied field is discussed. The relation between the transverse magnetization My and the applied field H is solved numerically. An excellent approximation for the transverse magnetization is My/Ms=A(1−H/Hk)2.5, where A=1.1434, and Hk is the anisotropy field. For curve fitting to experimental data, both A and Hk were used as fitting parameters. Comparison between a constructed torque hysteresis method and this vibrating sample magnetometer (VSM) RTM method is made theoretically and experimentally. Both results show that the VSM RTM will give a good extrapolation of the anisotropy field, whereas the torque measurement will slightly overestimate it. Anisotropy energy is calculated based on the anisotropy field and saturation magnetization for magnetic thin films. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.369104
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