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  • 1
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    Transient SEUs in a fiber optic system for space applications (1991)
    In:  Other Sources
    Details
    Publication Date: 2011-08-24
    Description: The results of an investigation on the SEU sensitivity for a fiber optic operating system are reported. Measurements were made on the upset cross sections for the system in static and dynamic modes of operation. The heavy ion SEU test facility at Brookhaven and the proton facility at Harvard University were used in this study. Cross sections were obtained for Honeywell transmitter and reciever devices operating in a system at a frequency of 100 kHz. Both devices were independently irradiated. The results show that the dynamic mode was the worst case, and the receiver was the most sensitive part type in the system. The threshold linear energy transfer (LET) for the receiver was determined to be 1.6 MeV sq cm/mg for the three input signals used in the tests, which were: a continuous high state, a low state, and a 100 kHz square wave.
    Keywords: OPTICS
    Type: IEEE Transactions on Nuclear Science (ISSN 0018-9499); 38; 1546-155
    Format: text
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    NASA TECHNICAL REPORTS
  • 2
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    Small Explorer Data System MIL-STD-1773 fiber optic bus (1992)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: The MIL-STD-1773 Fiber Optic Data Bus as implemented in the GSFC Small Explorer Data System (SEDS) for the Small Explorer Program is described. It provides an overview of the SEDS MIL-STD-1773 bus components system design considerations, reliability figures, acceptance and qualification testing requirements, radiation requirements and tests, error handling considerations, and component heritage. The first mission using the bus will be launched in June of 1992.
    Keywords: SPACE COMMUNICATIONS, SPACECRAFT COMMUNICATIONS, COMMAND AND TRACKING
    Type: NASA-TP-3227 , NAS 1.60:3227 , REPT-92B00041
    Format: application/pdf
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    NASA TECHNICAL REPORTS
  • 3
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    Technology Development Activities for the Space Environment and its Effects on Spacecraft (2003)
    In:  CASI
    Details
    Publication Date: 2019-07-13
    Description: Reducing size and weight of spacecraft, along with demanding increased performance capabilities, introduces many uncertainties in the engineering design community on how emerging microelectronics will perform in space. The engineering design community is forever behind on obtaining and developing new tools and guidelines to mitigate the harmful effects of the space environment. Adding to this complexity is the push to use Commercial-off-the-shelf (COTS) and shrinking microelectronics behind less shielding and the potential usage of unproven technologies such as large solar sail structures and nuclear electric propulsion. In order to drive down these uncertainties, various programs are working together to avoid duplication, save what resources are available in this technical area and possess a focused agenda to insert these new developments into future mission designs. This paper will describe the relationship between the Living With a Star (LWS): Space Environment Testbeds (SET) Project and NASA's Space Environments and Effects (SEE) Program and their technology development activities funded as a result from the recent SEE Program's NASA Research Announcement.
    Keywords: Spacecraft Design, Testing and Performance
    Type: AIAA/ICAS Internation Air and Space Symposium Exposition; Jul 14, 2003 - Jul 18, 2003; Dayton, OH; United States
    Format: application/pdf
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    NASA TECHNICAL REPORTS
  • 4
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    New Developments in Error Detection and Correction Strategies for Critical Applications (2016)
    In:  CASI
    Details
    Publication Date: 2019-07-13
    Description: The presentation will cover a variety of mitigation strategies that were developed for critical applications. An emphasis is placed on strengths and weaknesses per mitigation technique as it pertains to different FPGA device types.
    Keywords: Quality Assurance and Reliability; Electronics and Electrical Engineering
    Type: GSFC-E-DAA-TN32410 , 2016 Single Event Effects (SEE) Symposium and Military and Aerospace Programmable Logic Devices (MAPLD) Workshop; May 23, 2016 - May 26, 2016; San Diego, CA; United States
    Format: application/pdf
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    NASA TECHNICAL REPORTS
  • 5
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    Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data (2016)
    In:  CASI
    Details
    Publication Date: 2019-07-13
    Description: We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4 field programmable gate array (FPGA).
    Keywords: Electronics and Electrical Engineering
    Type: GSFC-E-DAA-TN32403 , Annual Single Event Effects (SEE) Symposium; May 23, 2016 - May 26, 2016; La Jolla, CA; United States|Military and Aerospace Programmable Logic Devices (MAPLD) Workshop; May 23, 2016 - May 26, 2016; La Jolla, CA; United States
    Format: application/pdf
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    NASA TECHNICAL REPORTS
  • 6
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    Silicon Carbide Power Device Performance Under Heavy-Ion Irradiation (2015)
    In:  CASI
    Details
    Publication Date: 2019-07-13
    Description: Heavy-ion induced degradation and catastrophic failure data for SiC power MOSFETs and Schottky diodes are examined to provide insight into the challenge of single-event effect hardening of SiC power devices.
    Keywords: Quality Assurance and Reliability; Space Radiation; Electronics and Electrical Engineering
    Type: GSFC-E-DAA-TN25023 , IEEE Nuclear and Space Radiation Effects Conference (NSREC); Jul 13, 2015 - Jul 17, 2015; Boston, MA; United States
    Format: application/pdf
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    NASA TECHNICAL REPORTS
  • 7
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    Heavy-Ion Testing of the Freescale Qorivva 32-bit Automotive-Grade MCU (2016)
    In:  CASI
    Details
    Publication Date: 2019-07-12
    Description: We present single-event effects testing results from a commercially-available automotive microcontroller. We discuss the difficulties encountered testing with commercially-provided evaluation boards while attempting to classify the complex and varied failure modes of a modern 32-bit microcontroller. This work also describes some of the possible advantages to using off-the-shelf automotive-grade electronics for low-risk aerospace applications.
    Keywords: Electronics and Electrical Engineering
    Type: GSFC-E-DAA-TN33286
    Format: application/pdf
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    NASA TECHNICAL REPORTS
  • 8
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    Xilinx Kintex-UltraScale Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report (2018)
    In:  CASI
    Details
    Publication Date: 2019-07-12
    Description: This is an independent investigation that evaluates the single event destructive and transient susceptibility of the Xilinx Kintex-UltraScale device. Design/Device susceptibility is determined by monitoring the device under test (DUT) for Single Event Transient (SET) and Single Event Upset (SEU) induced faults by exposing the DUT to a heavy ion beam. Potential Single Event Latch-up (SEL) is monitored throughout heavy-ion testing by examining device current. This device does not have embedded mitigation. Hence, user implemented mitigation is investigated using Synopsys mitigation tools.
    Keywords: Electronics and Electrical Engineering
    Type: GSFC-E-DAA-TN45195
    Format: application/pdf
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    NASA TECHNICAL REPORTS
  • 9
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    Microsemi RTG4 Rev C Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report (2019)
    In:  CASI
    Details
    Publication Date: 2019-07-20
    Description: The goal of this study was to perform an independent investigation of single event destructive and transient susceptibility of the Microsemi RTG4 device. The devices under test were the Microsemi RTG4 field programmable gate array (FPGA) Rev C. The devices under test will be referenced as the DUT or RTG4 Rev C throughout this document. The DUT was configured to have various test structures that are geared to measure specific potential susceptibilities of the device. DesignDevice susceptibility was determined by monitoring the DUT for Single Event Transient (SET) and Single Event Upset (SEU) induced faults by exposing the DUT to a heavy ion beam. Potential Single Event Latch-up (SEL) was checked throughout heavy-ion testing by monitoring device current.
    Keywords: Electronics and Electrical Engineering
    Type: GSFC-E-DAA-TN44754
    Format: application/pdf
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    NASA TECHNICAL REPORTS
  • 10
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    Silicon Carbide Power Devices and Integrated Circuits (2017)
    In:  CASI
    Details
    Publication Date: 2019-07-13
    Description: An overview of the NASA NEPP Program Silicon Carbide Power Device subtask is given, including the current task roadmap, partnerships, and future plans. Included are the Agency-wide efforts to promote development of single-event effect hardened SiC power devices for space applications.
    Keywords: Electronics and Electrical Engineering
    Type: GSFC-E-DAA-TN44037 , NEPP Electronics Technology Workshop; Jun 26, 2017 - Jun 29, 2017; Greenbelt, MD; United States
    Format: application/pdf
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    NASA TECHNICAL REPORTS
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