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  • 1
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 73 (2002), S. 2051-2056 
    ISSN: 1089-7623
    Quelle: AIP Digital Archive
    Thema: Physik , Elektrotechnik, Elektronik, Nachrichtentechnik
    Notizen: A couple of experimental techniques have been implemented to an aperture near-field scanning optical microscopy (NSOM) to obtain reliable measurement of sample dichroism on the local scale. First, a method to test NSOM tapered fiber probes toward polarization conservation into the near optical field is reported. The probes are characterized in terms of the in-plane polarization of the near field emerging from their aperture, by using a thin dichroic layer of chromophore molecules, structured along stretched polymeric chains, to probe such polarization when approached in the near-field region of the probe. Second, to assure that the light intensity coupled in the fiber is polarization independent, an active system operating in real time has been realized. Such combination of techniques allowed quantitative imaging of local dichroism degree and average orientation by means of dual-phase lock-in demodulation of the optical signal. Translation of the coupled light polarization state in the near field has been observed for one-half of the tested probes. For the others, the tip acts as a polarizer, and therefore showed it was not suitable for polarization modulation NSOM measurements. © 2002 American Institute of Physics.
    Materialart: Digitale Medien
    Standort Signatur Erwartet Verfügbarkeit
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  • 2
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 443-451 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Voltage-modulated scanning force microscopy has been employed to investigate the dynamics of ferroelectric domains as a function of time and temperature in triglycine sulfate (TGS) single crystals. Branching of the domain structure and nucleation of fine domain patterns by internal fields of thermal origin have been directly observed on the submicron scale. Domain coarsening after quenching TGS samples from the paraelectric phase into the ferroelectric one has been studied, revealing a nonlinear time dependence of the characteristic correlation domain length and supporting the validity of dynamical scaling law and the conservation of the total surface charge. Substantial differences in the evolution of the domain structure have been detected during cooling or heating treatment in the ferroelectric phase. Domain contrast is shown to monitor the ferroelectric phase transition through its temperature dependence, reflecting the competition between electrostatic and piezoelectric effects. © 2000 American Institute of Physics.
    Materialart: Digitale Medien
    Standort Signatur Erwartet Verfügbarkeit
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  • 3
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 5495-5497 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Near-field optical spectroscopy has been used to investigate photoluminescence features of porous silicon microcavity samples with a subwavelength space resolution. The emission is found to be markedly dependent on the lateral position, with the presence of relatively narrow spectral features peaked at different wavelengths in the range 610–690 nm. Furthermore, the spectrum obtained by summing up spectra taken at different sampling points (relative displacement ∼100 nm) recovers the standard (macroscopic) photoluminescence spectrum of porous silicon, except for the presence of a dip around the resonance wavelength of the microcavity resonator. © 2002 American Institute of Physics.
    Materialart: Digitale Medien
    Standort Signatur Erwartet Verfügbarkeit
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  • 4
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 2042-2044 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Optical observation of the polarization domain structure of a ferroelectric material (triglycine sulfate) is achieved using a reflection apertureless near-field optical microscope operating with an electrical ac polarization of the tip. By showing that there is no detectable contribution of the converse piezoelectric effect of the sample nor of the electrical forces acting on the tip in the optical signal detected, we explain the observed contrast between domains of opposite polarity by the electro-optic effect. Using the phase of the demodulated optical signal, we image the ferroelectric domain structure with a resolution better than 35 nm. © 2000 American Institute of Physics.
    Materialart: Digitale Medien
    Standort Signatur Erwartet Verfügbarkeit
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  • 5
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 1321-1323 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Voltage-modulated scanning force microscopy is applied to study the temperature dependence of the ferroelectric domain structure of triglycine sulfate up to TC, the ferroelectric transition temperature. The polarization image contrast exhibits a power-law decrease as TC is approached, associated with the competition between Maxwell stress and the converse piezoelectric effect. Substantial differences in the static and dynamic domain patterns are detected for two samples of different aging conditions. © 2000 American Institute of Physics.
    Materialart: Digitale Medien
    Standort Signatur Erwartet Verfügbarkeit
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  • 6
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 621-623 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: A method for optical near field discrimination, leading to drastic artifact reduction in superresolved imaging by scanning interference apertureless microscopy is presented. The method relies on second harmonic detection of the modulated optical signal scattered by a vibrating silicon tip. An edge resolution of 15 nm, or 7 nm Rayleigh-type resolution, with optical contrast as high as 50%, has been obtained on aluminum projection pattern samples in the constant gap width mode. Our method has been determined not to be affected by topographical artifacts by constant height mode scans. © 2000 American Institute of Physics.
    Materialart: Digitale Medien
    Standort Signatur Erwartet Verfügbarkeit
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  • 7
    Digitale Medien
    Digitale Medien
    Amsterdam : Elsevier
    Solid State Communications 91 (1994), S. 59-63 
    ISSN: 0038-1098
    Quelle: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Thema: Physik
    Materialart: Digitale Medien
    Standort Signatur Erwartet Verfügbarkeit
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  • 8
    Digitale Medien
    Digitale Medien
    Springer
    Il nuovo cimento della Società Italiana di Fisica 18 (1996), S. 1149-1157 
    ISSN: 0392-6737
    Schlagwort(e): Optoelectronic devices ; Other solid inorganic materials ; Time-resolved optical spectroscopies and other ultrafast optical measurements in condensed matter ; Interfaces ; heterostructures ; nanostructures ; Conference proceedings
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Physik
    Notizen: Summary We report the observation of strong red- and blue-light emission in free-standing porous-silicon samples prepared fromn + substrates at different anodization current densities. The surface morphology of the free-standing samples has been analyzed by means of atomic-force microscopy. Upon excitation with nanosecond pulses at room temperature, both blue and red luminescence bands appear, peaked around 3.2 and 2.0 eV, respectively. An extensive study of the time-resolved behavior of the photoluminescence signal reveals different dynamical features for the two spectral regions. The observed long decay time (several μs) of the red band reflects the predominant effect of non-radiative processes and is consistent with models based on excition diffusion through the interconnected silicon nanocrystals (quantum dots) skeleton. The relatively fast blue-band decay time (≈400 ns) is shown to be related to non-radiative recombination through trap states at the silicon nanocrystal surface.
    Materialart: Digitale Medien
    Standort Signatur Erwartet Verfügbarkeit
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  • 9
    Digitale Medien
    Digitale Medien
    Springer
    Il nuovo cimento della Società Italiana di Fisica 15 (1993), S. 279-292 
    ISSN: 0392-6737
    Schlagwort(e): Electron microscopy determinations (including scanning tunneling electron microscopy methods)
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Physik
    Notizen: Summary A scanning probe microscope operating in air with interchangeable atomic force-friction force (AFM-FFM) and electronic-tunnelling (STM) heads is presented. Our AFM operates in the so-called contact mode and utilizes the optical-lever detection method which allows simultaneous measurement of the topography as well as the lateral force. The set-up also contains an optical microscope to control both the sample and the probe laser spot on the cantilever. The experimental method to change from AFM to STM operation is based on the use of the probe laser beam and the optical microscope. The maximum scanning area is (24×24) μm2 and it is well embraced in the optical-microscope visual field. The microscope attains atomic resolution in air in both AFM and STM configuration. Its performance is demonstrated on the surface of different samples.
    Materialart: Digitale Medien
    Standort Signatur Erwartet Verfügbarkeit
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  • 10
    ISSN: 1432-0630
    Schlagwort(e): 61.16.Ch
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Maschinenbau , Physik
    Notizen: Abstract A novel method to analyze and to distinguish the non-dissipative component from the dissipative frictional component of the lateral force in a Scanning Force and Friction Microscope (SFFM) is worked out and applied to images acquired on various samples. We have determined the twisting spring constants of the cantilevers by computer statical analysis, since they are essential for the quantitative determination but are not provided by the manufacturer. Quantitative results for the μ D dynamical friction coefficient images are reported. Comparison with the forward-backward lateral force image subtraction model is made.
    Materialart: Digitale Medien
    Standort Signatur Erwartet Verfügbarkeit
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