Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
73 (1993), S. 4605-4609
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
X-ray emission spectroscopy with high-energy resolution was used for characterizing differences in the valence band of carbon films deposited by ion implantation in various conditions of bombardment and with various substrates, with respect to crystalline diamond and other diamondlike coatings. The obtained results were compared with calculations of the partial density of 2p states in defected diamond, and the nature of point defects in the implanted films could be identified. In addition, x-ray emission spectra of substrate atoms indicated a chemical interaction at some interfaces.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.352752
Permalink
|
Location |
Call Number |
Expected |
Availability |