ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A design of a total electron yield detector to collect x-ray absorption fine structure spectra between 80 K and room temperature is described. In addition, a three-stage goniometer setup has been incorporated into the detector to facilitate manipulation of the sample. The results of simple linearity checks to investigate the detector's electrical performance are presented. Finally, the detector's thermal stability is discussed. © 1994 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1144489
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