ISSN:
1432-0983
Keywords:
Key words Yeast cellular extract
;
DNA double-strand break
;
Fidelity of repair
Source:
Springer Online Journal Archives 1860-2000
Topics:
Biology
Notes:
Abstract We present a rapid in vitro method to scan the repair of DNA double-strand breaks (DSBs). A DSB was introduced at the EcoRI site within the lacZ gene of the plasmid pUC18 and the plasmid was exposed to cellular extracts from a wild-type repair-competent (RAD) and a mutant (rad52Δ) strain of the yeast Saccharomyces cerevisiae. The fidelity of rejoining was determined by the expression of the lacZ gene after bacterial transformation with the treated plasmid. A cellular extract from the yeast S. cerevisiae was found to be capable of rejoining DNA DSBs. Breaks at the EcoRI site were rejoined by extracts from both wild-type and mutant strains to form circular plasmids with almost equal efficiency. However, the fidelity of rejoining was lower for the rad52Δ extract than for normal wild-type.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s002940050300
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