ISSN:
1741-2765
Keywords:
Moiré interferometry
;
microstructure
;
crack tip
;
strain field
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract A high-magnification moiré interferometer, particularly suitable for near-tip field analysis in cracked materials, is described. It has a submillimeter field of view, a high-resolution image sensor (1.4 million pixels), X-Y-Z translation stage and an optical fiber light delivery system. These features enable the microscope head to observe the crack tip while the specimen is loaded in a standard tensile test machine. Automated fringe pattern analysis, using temporal phase shifting and spatial phase unwrapping, enables thex ory displacement component to be measured and the corresponding in-plane strain component computed. The displacement placement accuracy is better than 40 nm, and the effective strain gage dimension is ∼ 25 μm. Furthermore, the interferometer has a built-in white light microscope that allows the observation of the specimen granular microstructure in exact registration with the displacement field. The interferometer has hence been employed to investigate the near-tip fields of a precracked stainless steel specimen under load. The influence of the grain boundaries on the measured displacement fields was relatively minor. The near-tip strain field shows a significant asymmetrical behavior despite pure mode lloading conditions.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF02327553
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