Electronic Resource
s.l. ; Stafa-Zurich, Switzerland
Solid state phenomena
Vol. 116-117 (Oct. 2006), p. 587-590
ISSN:
1662-9779
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Physics
Notes:
Oscillation experiments, creep tests and shear stress ramps have been performed to analyzethe yield stress and its time dependency. It has to be distinguished between iso-structural, dynamicand static yield stress. The iso-structural yield stress occurs immediately after shearing. Since theslurry structure remains unchanged, it is equivalent to the structure during shearing. At rest an internalstructure builds up, this leads to an increase of the yield stress, which is referred to as the dynamicyield stress. It increases until its maximum value, the static yield stress, is reached
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/22/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.116-117.587.pdf
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