ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
An energy-dispersive x-ray diffraction technique for fluid materials under high pressure, up to 2000 bar, and high temperature, up to 1650 °C, has been developed using an x-ray source with high energy up to 70 keV, a high-pressure vessel with Be windows pressurized with He gas, and a new sample cell made of single crystal sapphire. Using this technique one can overcome several difficulties intrinsic with x-ray diffraction measurements of fluids, such as high vapor pressure and high x-ray absorption constant of samples, x-ray scattering and absorption by sample cells, and x-ray absorption by high-pressure vessels. In order to show an excellent potential of the equipment, examples of the experiments for the liquid-vapor subcritical fluid Hg and Se are reported. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1149556
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