Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
86 (1999), S. 5788-5793
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We present measurements of the nonlinear surface impedance Zs and the third-order intermodulation distortion (IMD) of a YBa2Cu3O7−x microstrip resonator, which is initially in the as-processed state and subsequently annealed at 450–600 °C. Zs of the as-processed sample in the high-dissipated-power range is explained in terms of the vortices in weak links. In the low-dissipated-power range, outputs of IMD are changed by annealing the resonator, and the minimum IMD generation is obtained with a sample annealed at 500 °C. By comparing the IMD generation of the samples with the crystalline structure measured by x-ray diffraction and transmission electron microscopy, it is shown that IMD of the YBa2Cu3O7−x film is generated at lattice distortions of the a−b plane in grains and grain boundaries. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.371594
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