ISSN:
1600-5775
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
A novel X-ray diffraction technique for the local structural characterization of thick specimens is presented. Broad energy-band focusing elements are used both on the incoming and exit (diffracted) side of the sample. The geometry allows imaging, and magnification, of a line through the thickness of the sample. In comparison with conventional methods of defining three-dimensional gauge volumes the new technique provides superior depth resolution, higher flux, and a remedy for some systematic errors occurring in strain measurements due to, for example, grain size effects. The technique is validated by a synchrotron test experiment using a bent and meridionally graded multilayer as the focusing analyser element. The incoming beam is monochromated, at 30 keV, and focused to a 15 µm spot size by means of a bent Laue crystal. The resulting depth profile from the (222) reflection of a 21 µm-thick rolled Au foil has a width of 44 µm. The depth resolution, magnification and reflectivity as a function of the energy bandwidth are found to be well matched by theory. The prospect of the technique and the associated aberrations are discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0909049599001934
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