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  • 1
    Electronic Resource
    Electronic Resource
    Vibrating mirror surface plasmon resonance immunosensor (1991)
    s.l. : American Chemical Society
    Analytical chemistry 63 (1991), S. 83-85 
    Details
    ISSN: 1520-6882
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/ac00001a017
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  • 2
    Electronic Resource
    Electronic Resource
    On the coherent vibrational phase in polarization sensitive resonance CARS spectroscopy of copper tetraphenylporphyrin (1997)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 106 (1997), S. 2589-2598 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Polarization sensitive multiplex spectroscopy of resonance coherent anti-Stokes Raman scattering (CARS) of copper(II)-tetraphenylporphyrin in solution (CH2Cl2) is reported. The measurements were performed in the Q band range of the porphyrin electronic absorption. Four polarized CARS spectra were resolved in 1300–1650 cm−1 Raman range and were simultaneously fitted with a single set of vibrational parameters (band positions, bandwidths, amplitudes, depolarization ratios, and phases). The obtained coherent vibrational phases of A1g, A2g, and B1g skeletal modes of the porphyrin macrocycle appeared to correlate strongly with the mode vibrational symmetry. The origin of such correlation is analyzed within a model of the third-order nonlinear electric susceptibility χ(3). The proposed model is based on multidimensional displaced harmonic oscillator in the Herzberg–Teller expansion of Raman polarizability. The coherent vibrational phases of modes of different symmetry classes are directly affected by the symmetry dependent vibronic couplings between the pairs of Qx, Qy and Bx, By electronic transitions of the porphyrin. The phase contrast between the modes of various symmetries is most pronounced near the Q00 resonance. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.473363
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  • 3
    Electronic Resource
    Electronic Resource
    A detailed analysis of the optical beam deflection technique for use in atomic force microscopy (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 6-12 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A Michelson interferometer and an optical beam deflection configuration (both shot noise and diffraction limited) are compared for application in an atomic force microscope. The comparison shows that the optical beam deflection method and the interferometer have essentially the same sensitivity. This remarkable result is explained by indicating the physical equivalence of both methods. Furthermore, various configurations using optical beam deflection are discussed. All the setups are capable of detecting the cantilever displacements with atomic resolution in a 10 kHz bandwidth.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.352149
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  • 4
    Electronic Resource
    Electronic Resource
    Three dimensional single-particle tracking with nanometer resolution (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 2762-2766 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have developed a method for three dimensional (3D) tracking of polystyrene spheres with nanometer resolution. The detection technique is based on measuring the displacement of a polystyrene sphere positioned in the center of a laser beam just behind the focus. A change in the lateral position of the sphere causes a deflection of the beam which can be measured using a position sensitive detector. A change in the axial position of the sphere causes a shift in the axial position of the focus behind another lens, which can be measured using an overfilled photodiode. A feedback system is used to keep the sphere in the center of the laser beam to avoid the influence of lateral displacements on the detection of the axial position. Spatial resolution for a 0.92 μm polystyrene sphere was better than 1 nm in three dimensions using a sampling rate of 1 kHz. This method was applied to track spheres bound to adhesion molecules LFA-1 expressed at the surface of living cells. It turned out to be a useful method to accurately measure the 3D trajectory of biological molecules on cells in real time. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1149012
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  • 5
    Electronic Resource
    Electronic Resource
    Compact stand-alone atomic force microscope (1993)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 2892-2897 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A stand-alone atomic force microscope (AFM) featuring large scan, friction measurement, atomic resolution, and liquid operation, has been developed. Cantilever displacements are measured using the optical beam deflection method. The laser diode and focusing lens are positioned inside the piezo tube and the cantilever at the end of the piezo tube. Because the laser beam stays on the cantilever during scanning, the scan range is solely determined by the characteristics of the piezo tube. In our case 30×30×9.5 μm3 (xyz). The optical beam deflection detection method allows simultaneous measurement of height displacements and torsion (induced by lateral forces) of the cantilever. AFM images of dried lymphocytes reveal features in the torsion images, which are only faintly visible in the normal height images. A new way of detecting the nonlinear behavior of the piezo tube is described. With this information the piezo scan is linearized. The nonlinearity in a 30-μm scan is reduced from 40% to about 1%, as is illustrated with images of a compact disk. The stand-alone AFM can be combined with a (confocal) inverted microscope, yielding a versatile setup for biological applications.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144378
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  • 6
    Electronic Resource
    Electronic Resource
    Resolution in surface plasmon microscopy (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 2829-2836 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: In this article we demonstrate how to obtain the ultimate lateral resolution in surface plasmon microscopy (SPM) (diffraction limited by the objective). Surface plasmon decay lengths are determined theoretically and experimentally, for wavelengths ranging from 531 to 676 nm, and are in good agreement. Using these values we can determine for each particular situation which wavelength should be used to obtain an optimal lateral resolution, i.e., where the plasmon decay length does not limit the resolution anymore. However, there is a trade-off between thickness resolution and lateral resolution in SPM. Because of the non-optimal thickness resolution, we use several techniques to enhance the image acquisition and processing. Without these techniques the use of short wavelengths results in images where the contrast has vanished almost completely. In an example given, a 2.5 nm SiO2 layer on a gold layer is imaged with a lateral resolution of 2 μm, and local reflectance curves are measured to determine the layer thickness. The SPM image is compared with an atomic force microscopy image of the same object. We obtain a 3 μm resolution when thickness differences within a lipid monolayer are imaged and measured.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144623
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  • 7
    Electronic Resource
    Electronic Resource
    Vacuum chamber for sample attachment in atomic force microscopy (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 4012-4013 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A small ring-shaped vacuum chamber has been constructed and connected to the piezotube used for scanning samples in the atomic force microscope (AFM). Samples made up of any material, up to 50 mm in diameter, can be firmly attached onto the piezotube without causing damage to the sample. A 50-l beer container forms a buffer between vacuum pump and chamber. With this supply of vacuum, the AFM can be operated for a 4–8 h period without turning on the vacuum pump again. Samples can be changed within 30 s. The scan frequency when using microscope slides is limited to 40 Hz due to resonance effects of the microscope slides.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143258
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  • 8
    Electronic Resource
    Electronic Resource
    Atomic force microscope with integrated optical microscope for biological applications (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 1914-1917 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Since atomic force microscopy (AFM) is capable of imaging nonconducting surfaces, the technique holds great promises for high-resolution imaging of biological specimens. A disadvantage of most AFMs is the fact that the relatively large sample surface has to be scanned multiple times to pinpoint a specific biological object of interest. Here an AFM is presented which has an incorporated inverted optical microscope. The optical image from the optical microscope is not obscured by the cantilever. Using a XY stage to move the sample, an object is selected with the optical microscope and an AFM image of the selected object can be obtained. AFM images of chromosomes and K562 cells show the potential of the microscope. The microscope further enables a direct comparison between optically observed features and topological information obtained from AFM images.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143303
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  • 9
    Electronic Resource
    Electronic Resource
    Adhesion force imaging in air and liquid by adhesion mode atomic force microscopy (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 65 (1994), S. 1195-1197 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new imaging mode for the atomic force microscope (AFM), yielding images mapping the adhesion force between tip and sample, is introduced. The adhesion mode AFM takes a force curve at each pixel by ramping a piezoactuator, moving the silicon-nitride tip up and down towards the sample. During the retrace the tip leaves the sample with an adhesion dip showing up in the force curve. Adhesion force images mapping parameters describing this adhesion dip, such as peak value, width, and area, are acquired on-line together with the sample topography. Imaging in air gives information on the differences in hydrophobicity of sample features. While imaging a mercaptopentadecane-gold layer on glass in demineralized water, the adhesion force could be modulated by adding phosphate buffered saline.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.112106
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  • 10
    Electronic Resource
    Electronic Resource
    Tapping mode atomic force microscopy in liquid (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 64 (1994), S. 2454-2456 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We show that standard silicon nitride cantilevers can be used for tapping mode atomic force microscopy (AFM) in air, provided that the energy of the oscillating cantilever is sufficiently high to overcome the adhesion of the water layer. The same cantilevers are successfully used for tapping mode AFM in liquid. Acoustic modes in the liquid excite the cantilever. On soft samples, e.g., biological material, this tapping mode AFM is much more gentle than the regular contact mode AFM. Not only is the destructive influence of the lateral forces minimized, but more important, the intrinsic viscoelastic properties of the sample itself are effectively used to "harden'' the soft sample.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.111597
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