Publication Date:
2015-04-11
Description:
Author(s): P. Schütz, F. Pfaff, P. Scheiderer, Y. Z. Chen, N. Pryds, M. Gorgoi, M. Sing, and R. Claessen We present a comprehensive study of the band bending and alignment at the interface of γ-Al 2 O 3 /SrTiO 3 heterostructures by hard x-ray photoelectron spectroscopy. Our measurements find no signs for a potential gradient within the polar γ-Al 2 O 3 film as predicted by the basic electronic reconstruction s... [Phys. Rev. B 91, 165118] Published Fri Apr 10, 2015
Keywords:
Electronic structure and strongly correlated systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
Permalink