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  • 1
    Electronic Resource
    Electronic Resource
    New York, NY : Wiley-Blackwell
    Rapid Communications in Mass Spectrometry 6 (1992), S. 690-696 
    ISSN: 0951-4198
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The ion detection process in a discrete-dynode electron multiplier can result in significant mass resolution losses in time-of-flight mass spectrometry (TOF-MS) for higher mass-to-charge (m/z) ion species. This resolution loss is attributed to propagation time delays and signal broadening in the ion detector. This is presumed tobe due to the generation o a distribution of secondary ion species produced initially upon impact of a primary ion with the first ynoe surface of the ion detector. Comparisons are made between the signals produced by a standard discrete dynode ion detector (which amplified the negatively chqrged species produced by impact of a primry ion) and a detector modified to respond to only the positively charged secondary ion species produced by a primary ion impact. Ion signals for higher m/z ions with the standard detector geometry are see to be due to a narrow signal component, most likely due to the generation o secondary electrons and/or very low mass secondary ions (H-), and a broad signal component, apparently due to secondary ions which take signifiant amounts of time to traverse the low potential fields between the first and second detector dynode. This results in ion signal tailing for higher m/z ion species. Numerical subtraction of the ion signal obtained with the standard and modified detector geometries (singly protonated molecular ion species of equine myoglobin) results in an improvement in mass resolution, such that a new adduct ion species (from trifluoroacetic acid) can be resolved.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 20 (1991), S. 203-208 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: X-ray fluorescence analysis was applied to the determination of the concentration of trace elements in the growth rings of trees. Some of these mineral elements can affect the growth and development of the plant. The results of the analytical measurements can provide information concerning the geochemical and atmospheric environment to which the tree has been exposed. It has been demonstrated that conventional x-ray fluorescence equipment is adequate to perform such measurements but, more important, the high intensity available from synchrotron radiation is an ideal source to probe the spatial variation in the low-level concentrations which can be transposed to an absolute temporal scale knowing the history of the tree. The ability to aperture or focus the synchrotron radiation to submillimeter size allows several points within individual rings to be analyzed, permitting a study of differences within a single growing season.Concentrations of mineral elements were determined in two types of tree samples, a cross-section of the trunk of a small sassafras tree and an incremental core from a red oak. Two experimental arrangements were employed, a special energy-dispersive x-ray analyzer with a primary beam size of 0.5 mm and a beam line at the National Synchrotron Light Source where the radiation was focused and apertured to 50 μm × 1 mm. Concentrations as low as 1 ppm were determined for nine elements. Major year-to-year variations were observed, implying that cross-ring elemental migration is slow (possibly negligible). The x-ray technique is fast and non-destructive, permitting the sample to be retained for additional studies.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
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