Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
80 (1996), S. 6570-6571
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
In this paper we comment on the interpretation of CV data in the presence of deep levels or interfacial layers. In order for the barrier height extracted from CV measurements to be reliable, no frequency dependence should exist at the measurement frequencies, and the slope of the 1/C2 vs voltage curve should not be temperature dependent. This is illustrated by data from Schottky barriers on 6H–SiC. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.363643
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