Publication Date:
2016-03-23
Description:
An automatic sample changer chamber for total reflection X-ray fluorescence (TXRF) and X-ray absorption near-edge structure (XANES) analysis in TXRF geometry was successfully set up at the BAMline at BESSY II. TXRF and TXRF-XANES are valuable tools for elemental determination and speciation, especially where sample amounts are limited (
Print ISSN:
0909-0495
Electronic ISSN:
1600-5775
Topics:
Geosciences
,
Physics
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