Publication Date:
2019-06-27
Description:
A universal wheat yield model applicable to both fall- and spring-planted wheat was developed to show separate and joint effects of weather and culture on yields. Data from state experiment stations in a wide range of climates in the U.S. Great Plains were used to build basic relationships among yields, weather, and culture. The application of the model on a macroclimatic scale in the U.S., the U.S.S.R., and India is discussed along with potential improvements.
Keywords:
EARTH RESOURCES AND REMOTE SENSING
Type:
CONTRIB-78-268-A
,
NASA. Johnson Space Center Proc. of Tech. Sessions, Vol. 1 and 2; p 951-959
Format:
text
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