Publication Date:
2015-02-03
Description:
Author(s): A. B. Mei, O. Hellman, N. Wireklint, C. M. Schlepütz, D. G. Sangiovanni, B. Alling, A. Rockett, L. Hultman, I. Petrov, and J. E. Greene Structural phase transitions in epitaxial stoichiometric VN/MgO(011) thin films are investigated using temperature-dependent synchrotron x-ray diffraction (XRD), selected-area electron diffraction (SAED), resistivity measurements, high-resolution cross-sectional transmission electron microscopy, and... [Phys. Rev. B 91, 054101] Published Mon Feb 02, 2015
Keywords:
Structure, structural phase transitions, mechanical properties, defects
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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