ISSN:
1432-0630
Keywords:
72.20
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract An exact analytical expression for the impact ionisation probability for the main ionisation process in a semiconductor with a Kane-type bandstructure is derived. In a parabolic approximation the integrals involved can be evaluated and the result reduces to the simple relationv i (E)=C(E−E i )2Θ(E−E i ) whereC is a material constant related to the transition matrix elements. From experimental results on the photo-quantum efficiency we can estimate the value ofC for InSb near 77 K, i.e.ħC ≈ 0.012 eV−1. It is concluded that the impact ionisation probability cannot be described with a unit step function at the threshold energy as was done in many theories on the avalanche effect. The (effective) threshold is smooth and a more detailed description, as derived here, is necessary.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00617768
Permalink