ISSN:
1618-2650
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
Notes:
Abstract An X-ray diffraction method is presented capable of determining the average particle size, microstrains, the probability of faults as well as a particle size distribution function in crystalline materials. The method is based on the Fourier analysis of a single X-ray diffraction profile. Results obtained on supported platinum catalysts used in H/D isotopic exchange reactions are reported. On the basis of experimental spectra and our XRLINE1 code all structural parameters could be obtained.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s0021663550367
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