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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 730-734 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We present the design and performance of an alkali ion source which is the injection stage of an ion beam system for surface scattering experiments in the range of 10 eV to 10 keV. In order to maximize emitter lifetimes, emphasis was placed on obtaining low phase space beams which minimize current losses in later stages of the optics. The source is based on a commercially available solid state β-eucryptite emitter, uses two stages of extraction for independent control of extracted current and final beam energy, and has a modified Pierce confinement electrode to control space charge spreading inside the source. Results of computer ray tracing are included to illustrate the operation of this source. Tests with K+ ions at 500 eV have produced beams which, in the range of 600–700 nA, were space-charge limited in transport through the remainder of the system. Beam currents measured more than 1 m downstream of the source are nearly independent of the emitter surface temperature over a range of 1023 to 1142 °C. Emitter lifetimes in excess of 200 h have been obtained. Using this source and our beamline optics, we have produced at the sample position low phase space beams ranging in energy from 10 eV to several kiloelectron volts.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 2560-2567 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have designed and constructed an apparatus that combines hyperthermal energy ion scattering (〈100 eV) with low-energy ion scattering (a few hundred eV to several keV). The UHV scattering chamber possesses a full range of sample preparation and characterization capabilities, including LEED, Auger spectroscopy, a Kelvin probe for work function measurements, and facilities for gas or alkali-metal deposition. The differentially pumped beamline provides well-collimated, monoenergetic beams of gas or alkali-metal ions ranging in energy from 〈10 eV to 10 keV. To illustrate the qualitative changes in the scattering behavior observed over this range, we present experimental results for Na+ scattered off the Cu(110) surface with the incident ion energy ranging from 56 eV to 4 keV. We also show a comparison between 1 keV K+ and 1 keV Ar+ scattered from the same surface.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 137-145 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have constructed and tested an UHV beamline to produce beams of alkali metal and noble gas ions over the energy range 〈20 eV to 10 keV with energy resolution ΔE/E of 1% or better. At the sample position, we have attained tens of nanoamps of current for keV energy beams in a 1–2-mm beam spot with about ±1° angular divergence, and nanoamps of current at 25 eV in a 4-mm beam spot with ±2° angular divergence. By applying Liouville's theorem to the beam's emittance and using waist-to-waist transport through the beam optics, the current on the sample is maximized while limiting the spot size and angular divergence. To achieve useful current at the lowest energies, special attention was paid to minimizing space-charge effects. Beam emittances measured at the sample position are consistent with Liouville's theorem. Equations for waist-to-waist transport are derived in the Appendix.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 2760-2764 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have constructed ion optics which, when interfaced with a channel electron multiplier (CEM), make possible quantitative measurements of positive and negative ion fluxes. We describe the design and operation of a detection system using these optics and present a calibration of the CEM for low energy (0.2–8.7 keV) positive and negative oxygen ions. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 672-678 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A time-of-flight spectrometer has been developed for measuring velocity- and angle-resolved distributions of neutral and ionized alkali atoms in the range of several electron volts to several thousand electron volts. The spectrometer is mounted on a rotating platform inside a previously existing ultra-high-vacuum scattering chamber equipped with a low-energy ion beamline. A high work function platinum foil, placed after a pair of angle-defining apertures, is used to ionize the alkali atoms, regardless of their incident charge states. After striking the platinum foil, the alkali ions are accelerated and detected with a channel electron multiplier. Velocity resolution of the scattered flux is achieved using standard time-of-flight techniques. Neutral and ionized alkali atoms are detected with the same high efficiency. The ion flux can be rejected by biasing a pair of rejection elements, and therefore absolute ratios of the neutral to total flux can be determined. Such a spectrometer can be used to probe the role of charge transfer in a number of dynamical processes at surfaces.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 597-599 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Persistent layer-by-layer removal of Au(111) during Ar+ ion irradiation was observed in a real-time x-ray scattering study. Over 100 specular beam intensity oscillations were measured. For a given ion energy, a smoother surface morphology is obtained when the ion flux is reduced. For a fixed erosion rate, ion energy in the range of 70–500 eV does not have a strong influence on the evolution of surface morphology. Diffuse scattering measurements show the development of features with a characteristic lateral length scale on the surface during ion irradiation. © 2000 American Institute of Physics.
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 3326-3330 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have performed measurements of the spatial distribution of current in various alkali and reactive ion beams over the energy range 5–600 eV using a Faraday cup. Ion beam current densities have been extracted from these measurements using a simple deconvolution procedure. Our results reveal that the beams are Gaussian in shape with a constant width, σ, for energies greater than approximately 75 eV and for all ion species investigated. This width is consistent with that determined from the distribution of oxygen on a Cu(001) crystal after an O+ ion beam deposition, measured using Auger electron spectroscopy. Using the measurement technique outlined in this article, together with the linear relationship between current density and Faraday cup current, it is possible to determine the beam current density using a single current measurement. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Springer
    Mycopathologia 97 (1987), S. 189-193 
    ISSN: 1573-0832
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology , Medicine
    Notes: Abstract A case is presented in which yeastlike cells resembling the yeast phase of Paracoccidioides brasiliensis were observed by microscopic examination of a urine sample. A mold identified as Mucor circinelloides was isolated from the specimen. It was converted to the yeast form by cultivation on Sabouraud agar incubated in a GasPak jar at 37 ° C. The isolate was eventually shown not to be related to the patient's illness; however, the superficial resemblance of the yeast phase to P. brasiliensis caused some confusion in making a correct diagnosis.
    Type of Medium: Electronic Resource
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  • 9
    Publication Date: 1997-04-21
    Print ISSN: 0031-9007
    Electronic ISSN: 1079-7114
    Topics: Physics
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  • 10
    Publication Date: 1995-08-21
    Print ISSN: 0031-9007
    Electronic ISSN: 1079-7114
    Topics: Physics
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