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  • 1
    Electronic Resource
    Electronic Resource
    The effect of residual solvent on the profiles of thick positive DNO-photoresist for Microsystem Technologies (1996)
    Springer
    Microsystem technologies 2 (1996), S. 50-55 
    Details
    ISSN: 1432-1858
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Technology
    Notes: Abstract  To fabricate microstructures with heights between 10 and 100 μm and smallest structural dimensions of several micrometers optical lithography is widely used. In this case positive photoresists of the DQN-type together with contact printing have been used by various groups to produce templates for electroplating. A common feature of the resist processes described in the literature is a concave resist profile with the narrowest part at approximately 2/3 of the resist height. As the structure width becomes smaller, the vanishing of this neck determines the smallest structures that can be obtained. This corresponds to a maximum aspect ratio of about 6. Within a model for the resist development based on percolation theory, a quadratic dependence of the dissolution rate on the solvent concentration is postulated in the theoretical section. The solvent concentration may be measured by weighing samples before and after baking and the overall content may be varied by different baking times in the range between 10 and 25%. The measurement of the average dissolution rate qualitatively supports the quadratic dependence postulated by the theory. A depth resolved measurement of the dissolution rate shows a significantly reduced rate in the top 1/3 of unexposed resist which suggests that the solvent content in the top 1/3 is drastically reduced. Based on the model, a detailed discussion of various experimental effects of thick DNQ-resists follows. In particular, the dried surface of the resist is made responsible for the concave resist profile in the top parts while near the substrate details of exposure dose, resist bleaching and diffraction need to be taken into account. In view of fabricating microstructures using DQN-resists with a high aspect ratio near 10 and vertical sidewalls, the baking as well as resist performance and exposure optics will have to be optimized.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s005420050015
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  • 2
    Electronic Resource
    Electronic Resource
    The effect of residual solvent on the profiles of thick positive DNO-photoresist for Microsystem Technologies (1996)
    Springer
    Microsystem technologies 2 (1996), S. 50-55 
    Details
    ISSN: 1432-1858
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Technology
    Notes: Abstract To fabricate microstructures with heights between 10 and 100 μm and smallest structural dimensions of several micrometers optical lithography is widely used. In this case positive photoresists of the DQN-type together with contact printing have been used by various groups to produce templates for electroplating. A common feature of the resist processes described in the literature is a concave resist profile with the narrowest part at approximately 2/3 of the resist height. As the structure width becomes smaller, the vanishing of this neck determines the smallest structures that can be obtained. this corresponds to a maximum aspect ratio of about 6. Within a model for the resist development based on percolation theory, a quadratic dependence of the dissolution rate on the solvent concentration is postulated in the theoretical section. The solvent concentration may be measured by weighing samples before and after baking and the overall content may be varied by different baking times in the range between 10 and 25%. The measurement of the average dissolution rate qualitatively supports the quadratic dependence postulated by the theory. A depth resolved measurement of the dissolution rate shows a significantly reduced rate in the top 1/3 of unexposed resist which suggests that the solvent content in the top 1/3 is drastically reduced. Based on the model, a detailed discussion of various experimental effects of thick DNQ-resists follows. In particular, the dried surface of the resist is made responsible for the concave resist profile in the top parts while near the substrate details of exposure dose, resist bleaching and diffraction need to be taken into account. In view of fabricating microstructures using DQN-resists with a high aspect ratio near 10 and vertical sidewalls, the baking as well as resist performance and exposure optics will have to be optimized.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF02447750
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  • 3
    Electronic Resource
    Electronic Resource
    A micro cycloid-gear system fabricated by multi-exposure LIGA technique (2000)
    Springer
    Microsystem technologies 6 (2000), S. 149-153 
    Details
    ISSN: 1432-1858
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Technology
    Notes: Abstract  In this paper, a prototype of 2 mm-diameter micro-cycloid gear system fabricated by the multi-exposure LIGA technique is presented. The gear system is composed of a casing and three vertically stacked disks and gears. Each part consists of three different levels. The first level, 40 μm high, was fabricated by UV-lithography, and the second as well as the third level, 195 μm and 250 μm high respectively, were processed by aligned deep X-ray lithography (DXL). The alignment error between two DXL-processed layers has been measured to be within ±5 μm range. As a result of the height control process, the deviation of structural height has been maintained within ±3 μm range for the UV-lithography-processed structures, and ±10 μm for the DXL-processed structures. Preliminary tests of gear assembly have been implemented with 125 μm-diameter commercially available glass fiber, and the further efforts are being carried out.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s005420050185
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  • 4
    Electronic Resource
    Electronic Resource
    Nomenclature and generation of three-periodic nets: the vector method (1984)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 40 (1984), S. 42-50 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Three-periodic nets are connected graphs which permit embeddings having a threefold periodicity. To many crystal structures such nets can be meaningfully assigned and used to express the topology of the structures. It is shown that such a net can be fully characterized by a finite graph in which the edges are labelled in a suitable way. The reversal of the process of assigning a labelled finite graph to a given net can be used to generate nets of real and hypothetical crystal structures in a systematic fashion.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767384000088
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  • 5
    Electronic Resource
    Electronic Resource
    Temporal Release of Flavor Compounds from Low-fat and High-fat Ice Cream During Eating (2003)
    Oxford, UK : Blackwell Publishing Ltd
    Journal of food science 68 (2003), S. 0 
    Details
    ISSN: 1750-3841
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition , Process Engineering, Biotechnology, Nutrition Technology
    Notes: : Fat controls the intensity and the release rate of volatile compounds because of its solvent property. Our objective was to understand the effect of fat on the flavor release behavior exhibited while ice cream is eaten. The temporal flavor profiles of ice creams, which contained various fat levels and were spiked with known amounts of selected volatiles, were determined by a temporal modified purge and trap and time-intensity analyses. Stale and cherry flavors were released faster and at higher intensities as fat content decreased. Fat had the opposite effect on vanilla flavor release. Temporal modified purge and trap analysis was an effective method to observe the release of some flavor compounds.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1365-2621.2003.tb07035.x
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  • 6
    Electronic Resource
    Electronic Resource
    Characterization of a sodium-dependent taurine transporter in rabbit choroid plexus
    Amsterdam : Elsevier
    Biochimica et Biophysica Acta (BBA)/Biomembranes 1193 (1994), S. 10-16 
    Details
    ISSN: 0005-2736
    Keywords: Central nervous system ; Sodium dependence ; Taurine ; Taurine transport
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Biology , Chemistry and Pharmacology , Medicine , Physics
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0005-2736(94)90326-3
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  • 7
    Electronic Resource
    Electronic Resource
    Early inhibition of the Na^+K^+-ATPase ion pump during acetaminophen-induced hepatotoxicity in rat
    Amsterdam : Elsevier
    Biochemical and Biophysical Research Communications 149 (1987), S. 203-207 
    Details
    ISSN: 0006-291X
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Biology , Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1016/0006-291X(87)91624-X
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  • 8
    Electronic Resource
    Electronic Resource
    A common enzyme may be responsible for the conversion of organic nitrates to nitric oxide in vascular microsomes
    Amsterdam : Elsevier
    Biochemical and Biophysical Research Communications 185 (1992), S. 932-937 
    Details
    ISSN: 0006-291X
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Biology , Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1016/0006-291X(92)91716-4
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  • 9
    Electronic Resource
    Electronic Resource
    Determination of the concentration and temperature dependence of the fundamental energy gap in AlxIn1−xSb (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 3132-3134 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We use transmission spectroscopy to determine the energy gap for the AlxIn1−xSb alloy system in the Al concentration range from 0% to 25% from cryogenic to room temperature. The samples are epitaxial layers grown by molecular beam epitaxy on GaAs substrates. Our room temperature results are compared to those from two earlier studies. In our Al concentration range, we find a linear change of energy gap with alloy lattice constant. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.122696
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  • 10
    Electronic Resource
    Electronic Resource
    Yellow luminescence and persistent photoconductivity of undoped n-type GaN (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 5454-5459 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Deep-level defect-related optical properties of undoped n-type GaN grown by metalorganic chemical vapor deposition are investigated using photoluminescence (PL), optical absorption (OA), photoconductivity (PC), and persistent photoconductivity (PPC) measurements. From the temperature dependence of the PL and OA, we find that the yellow luminescence (YL) is due to shallow-to-deep donor recombination. PL, PC, and PPC results manifest a strong correlation in properties related to deep levels. Samples which emit YL exhibit a PC peak at 1.9 eV due to the photoionization of deep levels as well as to the persistent photoconductivity effect, whereas samples with no YL have no PC peak in the forbidden gap and no PPC at any photon energy, suggesting a common origin. Furthermore, two types of PPC behavior were observed depending on the sample quality: typical stretched exponential decay in relatively thick samples and photocurrent quenching and a subsequent reduction of the dark current in thin samples. An explanation of the latter phenomenon based on photoinduced metastable electron traps in a highly defective layer near the interface is suggested from the temporal behavior of the PC. These traps seem to disappear slowly after the illuminating light is turned off. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1342024
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