Publication Date:
2014-04-18
Description:
Author(s): Chris Mann, Damien West, Ireneusz Miotkowski, Yong P. Chen, Shengbai Zhang, and Chih-Kang Shih Using scanning tunneling microscopy and ab initio simulations, we have identified several configurations for Cu dopants in CuxBi2Se3, with Cu intercalants being the most abundant. Through statistical analysis, we show strong short-range repulsive interactions between Cu intercalants. At intermediate... [Phys. Rev. B 89, 155312] Published Thu Apr 17, 2014
Keywords:
Semiconductors II: surfaces, interfaces, microstructures, and related topics
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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