ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    New design of the variable angle infrared spectroscopic ellipsometer using double Fourier transforms (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 2677-2683 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new type of incidence-angle-variable infrared spectroscopic ellipsometer working in the 2100–10 000 wave number range has been designed and constructed. For the system, the analyzer and polarizer were driven by two microstepping motors having hollow shafts and rotating synchronously with a speed ratio of 2:1, i.e., A=2P. The incidence angle can be varied from 30° to 90° with an accuracy of 0.01°. The doubled Fourier transforms as both functions of the wave number and the azimuthal angles of the polarizer and analyzer were carried out and integrated in the system. Two sets of ellipsometric parameters measured in the experiment have been used to test the data self-consistency of the system. In data reduction, the error arising from the slight anisotropy of the stray light was corrected. In application, the complex dielectric function of the Au film was measured with a data accuracy better that 1% in the entire spectral range. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150674
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Enhanced magneto-optic Kerr effects in thin magnetic/metallic layered structures (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 2479-2481 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Enhanced Kerr rotation spectra are measured in thin magnetic layers on silver. Also, variable angle of incidence spectroscopic ellipsometry is employed to measure the optical dielectric function of both the thin magnetic layer and the underlying thick silver layer. These results are explained quantitatively using the electromagnetic theory for reflection of light from multiple layers of isotropic and gyrotropic materials.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.102004
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Determination of Mn composition in Zn1−xMnxSe from Faraday rotation analysis : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 5193-5194 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In Zn1−xMnxSe, Mn2+ d→d* transitions were found to induce giant Faraday rotation, and peaks of the Faraday rotation spectra were red-shifted linearly with increasing Mn composition. Through studying the magneto-optical transition variation with Mn composition, the Mn composition can be determined. Results from the Faraday rotation analysis were compared with the x-ray diffraction data and were found in good agreement with each other. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361336
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 4
    Electronic Resource
    Electronic Resource
    The magneto-optical and optical properties of ultrathin Fe films in the short-wavelength range (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 8011-8014 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magneto-optical and optical properties of ultrathin Fe films sandwiched between Au layers were studied. A pronounced Kerr rotation peak is observed respectively in the photon energy range of 3.6–3.8 eV when the Fe layer is thinner than 1.5 nm, and in the range of 3.4–3.5 eV for thicker Fe layers. In simple calculations, the Kerr rotation peak is demonstrated to originate from the variation of the off-diagonal element in dielectric tensor of the Fe layers. The relative peak height Δθk, the normalized Kerr rotation θkn, and the effective optical constants at the photon energy of 3.5 eV are found to oscillate as a function of dFe. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.362352
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 5
    Electronic Resource
    Electronic Resource
    Deposition of C60 films by partially ionized fullerene beams (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 4142-4144 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: C60 films have been deposited by partially ionized cluster beam deposition in which a C60 beam is partially ionized by electron impact and then accelerated by an acceleration field Va towards the substrate where the films are deposited. The experimental results show that the ionized C60 molecules in the evaporated beam are fragmented upon collision with the substrate under the elevated accelerating fields Va. Particularly, as Va exceeds about 400 V, almost all the C60 molecules including ionized and unionized ones are broken into fragments in the deposition films and the resulting films turn out to be amorphous carbon layers, as indicated by the measurements of Raman spectra, x-ray diffraction, and ellipsometry. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.359504
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 6
    Electronic Resource
    Electronic Resource
    Magnetic and magneto-optical properties of multilayers Fe-Si/Pd (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 7488-7491 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetic and magneto-optical properties of Fe-Si/Pd multilayers prepared by rf sputtering were studied. For Fe-Si/Pd multilayers with a fixed Fe-Si layer thickness dm of 15 A(ring) and the Pd layer thickness dp increasing from 10.8 to 18 A(ring), the saturation magnetization Ms and the Kerr rotation θk decrease sharply and reach a minimum. With dp further increasing, the multilayers increase. Ms is almost constant and θk decreases slightly when dp(approximately-greater-than)36 A(ring). For Fe-Si/Pd (54 A(ring)) multilayers the room temperature Ms decreases and θk increases, respectively, with increasing dm. This is caused by the spin-polarization effect of Pd atoms near the interfaces.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.354972
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 7
    Electronic Resource
    Electronic Resource
    Kerr effect of two-medium layered systems (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 7547-7555 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Detailed and practical expressions are given for the magneto-optical Kerr effect (MOKE) for various configurations of two media. One is a magneto-optic (MO) one, and the other is a nonmagnetic (NM) medium. For a system of two thick media with a single interface, with a first-order approximation in MOKE term Q, the Kerr function is determined by the product of a MOKE term Q and an optical term η. A second type of system includes a thin MO (or NM) layer deposited on a thick NM (or MO) substrate. For a MO/(NM-substrate) configuration, the Kerr function is related to the Kerr effects from the air/MO and MO/NM interfaces, and to the Faraday effects of the MO layer, as well as to interference effects. The enhancement factor can be expected to be large by proper choice of materials. For a NM/(MO-substrate) configuration, the total Kerr function is related to the Kerr effect from the NM/MO interface and can be enhanced by interference. The enhancement factor is expected to be less than one if the NM layer is strongly absorbing. Calculations of Kerr effects for examples of the PtMnSb/AuAl2 and Fe/Cu configurations are given. These indicate that the peaks shown in the onset region of the interband transitions of Cu can be attributed to a dramatic change of the refractive index in that region. The merits of a MO/(NM-metallic) structure have been evaluated, and indicate that a better Kerr enhancement effect can be achieved if the refractive index of the MO layer is larger than one and is much larger than that of the metallic material. A drawback to this configuration comes from the fact that a MO material with a large refractive index value usually is not expected to have a large intrinsic Kerr effect.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.345818
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 8
    Electronic Resource
    Electronic Resource
    Optical and magneto-optical characterization of TbFeCo thin films in trilayer structures : 35th annual conference on magnetism and magnetic materials (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 4568-4570 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A series of TbFeCo films ranging in thickness from 100 to 800 A(ring) have been deposited in trilayer structures on silicon wafer substrates, with Si3N4 being employed as the dielectric material. These films have been characterized both optically and magneto-optically by variable angle of incidence spectroscopic ellipsometry, normal angle of incidence reflectometry, and normal angle of incidence Kerr spectroscopy. From these measurements, the optical constants n and k have been determined for the TbFeCo films, as well as the magneto-optical constants Q1 and Q2. Results are presented that demonstrate the lack of dependence of these constants on the thickness of the TbFeCo film, and which can be used for calculating the expected optical and magneto-optical response of any multilayer structure containing similar TbFeCo films.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.348312
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 9
    Electronic Resource
    Electronic Resource
    Ellipsometric analysis of computer disk structures (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 4878-4880 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have used variable angle spectroscopic ellipsometry (VASE) to analyze the materials surfaces and interfaces in multilayer sputtered media computer disks. Specifically, the system C/CoNiCr/Cr/NiP/Al has been investigated for layer thicknesses, interfacial and surface roughness, and radial and circumferential uniformity. By first characterizing the Cr/NiP/Al then CoNiCr/Cr/NiP/Al structures, we were able to fully characterize the complete disk structure. The interface width between the carbon layer and CoNiCr magnetic layer was determined to be approximately 260 A(ring). This is reasonable considering typical surface roughness present on magnetic disks, and that the carbon "fills'' in this surface roughness. VASE is a nondestructive technique and used at atmospheric pressure, and is thus suitable for use in a production environment.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.344765
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 10
    Electronic Resource
    Electronic Resource
    Variable angle of incidence analysis of magneto-optic multilayers (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 4801-4802 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have applied the technique of variable angle of incidence spectroscopic ellipsometry (VASE) to the analysis of multilayered magneto-optic structures. With this instrument we measure the complete pseudodielectric tensor (diagonal and off-diagonal elements) for the sample of interest at variable angles of incidence. We have also developed computer software to perform a best-fit analysis of the measured data, providing optical constants, Voigt parameters, and layer thicknesses for the individual layers in the sample. Additionally, given an estimate of the material parameters, this software will provide an estimate of the optimum spectral range and angles of incidence for accurate characterization of the sample. An example of the above is given for a series of thicknesses of Dy/Co compositionally modulated multilayers deposited on a thick silver layer and subsequently overcoated with a thick layer of SiO. Results confirm the predicted optimum range of accuracy for this material system and effectively delineate the useful spectral range of this technique.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.344792
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...