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  • 1
    Electronic Resource
    Electronic Resource
    Application of a position-sensitive detector to atom probe microanalysis (1988)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 862-866 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A position-sensitive detector system based on a wedge-and-strip anode has been used to build a short flight-path atom probe which identifies both the chemical nature and position of single atoms field evaporated from the surface of a field-ion specimen. The detector also allows digitized field-ion images to be obtained from the region being analyzed. The prototype instrument has a lateral resolution during analysis of substantially below 1 nm, and a depth resolution of one atomic layer. Initial applications of the instrument to the analysis of nanometer-scale precipitates in metallic alloys has shown the capability of reconstructing the three-dimensional microstructure and microchemistry of materials.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1139794
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  • 2
    Electronic Resource
    Electronic Resource
    Performance of an energy-compensated three-dimensional atom probe (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 49-58 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A wide acceptance angle first-order reflectron lens has been incorporated into a three-dimensional atom probe (3DAP) to provide improved mass resolution. This new 3DAP instrument is capable of resolving isotopes in the mass spectrum, with resolutions better than m/Δm=500 full width at half maximum and 250 full width at 10% maximum. However, use of a reflectron for energy compensation within an imaging system means that improvements in mass resolution result in degradation of the spatial resolution. This article addresses the detailed design of the energy compensated 3DAP, and the minimization and compensation of chromatic aberrations in the imaging performance of the instrument. Some applications of the new instrument are included to illustrate its capabilities in the atomic-scale analysis of engineering alloys. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148477
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  • 3
    Electronic Resource
    Electronic Resource
    Design of a scanning atom probe with improved mass resolution (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 3016-3023 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A design for a high mass resolution scanning atom probe is described, which utilizes a two-conductor microelectrode held at 10–100 μm from the specimen. Field evaporation pulses are applied to the part of the counter-electrode closest to the specimen, while the output is maintained at ground. If the gap between the two conductors is small, field evaporated ions pass through the microelectrode while the pulse voltage is essentially constant, and thus the resultant spread in ion energies is small and the mass resolution in time-of-flight mass spectrometry is correspondingly improved. Initial results indicate improvements of 4–5 times over the mass resolution obtained with a simple counter electrode. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1304877
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  • 4
    Electronic Resource
    Electronic Resource
    Atom probe studies of the composition of low-temperature oxides on (100) silicon and gallium arsenide surfaces (1989)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 65 (1989), S. 5089-5095 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Pulsed laser atom probe microanalysis has been used to investigate the stoichiometry of low-temperature oxides on silicon and gallium arsenide. The composition of hydrophobic oxides grown on silicon after cleaning in hydrofluoric acid solutions is shown to tend to SiO as the oxide layer thickens. By contrast, hydrophilic oxides grown by low-temperature chemical treatments have a layered structure, SiO2 /SiO/Si. Low-temperature air-grown and chemical oxides on GaAs have a composition (GaAs)2O3 , and are covered by a layer of adsorbed water. This same composition is also approached by thermal oxides grown between 300 and 400 °C in a low partial pressure of oxygen.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.343185
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  • 5
    Electronic Resource
    Electronic Resource
    Microstructure and domain studies in Alnico 5 and Alnico 7 (abstract) (1985)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 57 (1985), S. 4173-4173 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetization processes in Alnico alloys depend on details of the microstructure on a very fine scale. In this paper, we report the results of studies carried out in more detail and at higher resolution than any previous study. Field ion microscopy (FIM) and atom probe microanalysis (AP) were used for microstructure studies, and high-voltage electron microscopy (HVEM) for studies of both the microstructure and magnetization processes. The composition of the two phases was studied with the new VG Scientific FIM100 AP recently installed in Oxford. Its high mass resolution and vacuum of 10−11 mbar have enabled the composition of the two phases to be accurately determined. The results differ significantly from another recent determination. Information has also been obtained on the ordering of both phases, their interconnectivity and the nature of the interfaces between them. Both phases were found to be partially ordered. In Alnico 5, both isolated and interconnected particles were found. The HVEM has been used to study the microstructure over larger areas, and to study the domain structure. In Alnico 7, particles of the strongly magnetic phase appeared to be more isolated than in Alnico 5, but this result is still to be confirmed by AP. It has also been possible to carry out in situ magnetization studies in the HVEM on specimens heat treated to reduce the coercivity. In Alnico 5, domain wall motion has been observed. In Alnico 7, domains have been observed for the first time. A new model for the coercivity is proposed in the light of these results, which agrees well with both the present results and those of other workers. Studies continuing at present should enable the differences between the magnetic properties of Alnico 5 and Alnico 7 to be explained.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.334654
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  • 6
    Electronic Resource
    Electronic Resource
    Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 1125-1127 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Focused ion-beam milling has been used to fabricate field-ion specimens from a multilayer film structure containing 100 repetitions of a (Cu2 nm/Co2 nm) bilayer deposited directly onto a planar substrate. The as-deposited films showed a magnetoresistance ratio of ∼5% over a 250 Oe range at room temperature, and a coercivity of ∼60 Oe. The magnetic data suggest that the films are coupled ferromagnetically. Successful field-ion specimen preparation has allowed the observation of these layers by field-ion imaging and three-dimensional atom probe compositional analysis. Examination of the multilayer images reveals that, in some regions, the layers are nonparallel, but the interfaces are chemically quite sharp, with a diffuse interface region of ∼3 atomic layers. In addition, in some areas adjacent cobalt layers appear to be in contact. The fact that the layers are wavy suggests that the ferromagnetic coupling may be a result of Néel "orange peel" type magnetostatic coupling between adjacent cobalt layers. The relatively high coercivity may be a result of the poor layer planarity leading to a high number of domain wall pinning sites. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.122104
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  • 7
    Electronic Resource
    Electronic Resource
    Partitioning behavior and the effect of Co on the Curie temperature of nanocomposite PrFeCoB hard magnetic alloys (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 797-799 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The microstructure and phase chemistry of melt-spun nanocomposite Pr9.7Fe76.6Co7.8B5.9 and Pr9.2Fe69.4Co15.4B6.0 ribbons have been studied using three-dimensional atom probe (3DAP) and transmission electron microscopy. The microstructure of these alloys consists of two phases, bcc α-Fe–Co and tetragonal Pr2(FeCo)14B. Practically all of the B and Pr atoms are rejected from the α-Fe–Co phase and are concentrated into the 2/14/1 hard magnetic phase. However, no significant difference of Co concentration between the two phases is observed. From the measured Co concentration in the 2/14/1 phase, it is explained why the effect of Co content on Curie temperature (Tc) is greater in the nanocomposite alloys than in single phase alloys. Predictions of Tc for the nanocomposite alloys based on the 3DAP composition data show excellent agreement with experimental measurements. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1388879
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  • 8
    Electronic Resource
    Electronic Resource
    Atom probe analysis of a ceramic oxide superconductor (1988)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 52 (1988), S. 1020-1022 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Field-ion specimens have been produced from a bulk ceramic yttrium barium cuprate superconductor, allowing quantitative atom probe analysis from this new class of materials. This technique offers the potential for high-resolution quantitative analysis for oxygen concentrations in the near-surface regions and the study of microchemistry of contact/superconductor interfaces. Preliminary results are presented on bulk compositions and the surface modifications following vacuum annealing.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.99232
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  • 9
    Electronic Resource
    Electronic Resource
    Application of position sensitive atom probe to the study of the microchemistry and morphology of quantum well interfaces (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 1555-1557 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The morphology and microchemistry of interfaces in GaInAs/InP quantum well structures have been studied with extremely high resolution by the new technique of position sensitive atom probe microanalysis. This letter presents some preliminary results demonstrating the power of the technique in determining the structure and chemistry of individual interfaces in multilayer epitaxial semiconductor samples.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.101328
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  • 10
    Electronic Resource
    Electronic Resource
    1990 C R Burch prize-joint award - The position-sensitive atom probe
    Amsterdam : Elsevier
    Vacuum 42 (1991), S. 605-611 
    Details
    ISSN: 0042-207X
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0042-207X(91)91485-7
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