ISSN:
1600-5724
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Chemistry and Pharmacology
,
Geosciences
,
Physics
Notes:
High-index, rutile-derived, crystallographic shear (CS) structures occupy the composition range (Ti, Cr)Ox, 1.875 ≤ x ≤ 1.93. The CS plane rotates continuously from (121), to (132), about the [1{\bar 1}1]r zone axis, producing a continuous series of intermediate CS planes with (hkl)r = p. (121)r + q. (011)r. In the reciprocal lattice a fine net of superstructure reflexions rotates continuously relative to a coarse net of rutile subcell reflexions. Analogous reciprocal-lattice behaviour should be a general crystallographic phenomena and may appear in any system where superstructures occur. It is shown how the intermediate diffraction patterns may be indexed by deriving a single transformation matrix relating the unit cells of the high-index superstructures to that of the basic subcell.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0567739474000544
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