ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The first systematic measurements of the electron temperature (Te) spatial profile have been obtained in the reversed field pinch experiment RFX with a single pulse Thomson scattering (TS) diagnostic. Scattered light from a ruby laser pulse (E≤15 J, Δt=30 ns) is collected through three objectives from 10 positions along a diameter in the plasma equatorial plane, with a spatial resolution of 2.5 cm. Plasma discharges with current in the range 700–900 kA have been investigated finding evidence of a quite flat Te profile. Data dispersion significantly greater than experimental uncertainties provides an indication of remarkable plasma fluctuations. Results are in good agreement with Te measurements from other single chord spectroscopic diagnostics (SiLi detector and SXR double filter), showing a reliable operation down to an electron density ne=3×1019 m−3. Integration of this apparatus with a ND:YLF laser system for multipulse Thomson scattering measurements, sharing the same input optics, is under way. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1147762
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