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  • 1
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    In reply: auger electron angular distributions from surfaces: forward focusing or silhouettes? (1990)
    American Association for the Advancement of Science (AAAS)
    Details
    Publication Date: 1990-06-01
    Description: 〈br /〉〈span class="detail_caption"〉Notes: 〈/span〉Wang, X D -- Han, Z L -- Tonner, B P -- Chen, Y -- Tong, S Y -- New York, N.Y. -- Science. 1990 Jun 1;248(4959):1129-31.〈br /〉〈span class="detail_caption"〉Record origin:〈/span〉 〈a href="http://www.ncbi.nlm.nih.gov/pubmed/17733375" target="_blank"〉PubMed〈/a〉
    Print ISSN: 0036-8075
    Electronic ISSN: 1095-9203
    Topics: Biology , Chemistry and Pharmacology , Computer Science , Medicine , Natural Sciences in General , Physics
    Published by American Association for the Advancement of Science (AAAS)
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  • 2
    Electronic Resource
    Electronic Resource
    Anomalous perpendicular magnetism in Ni/Cu(001) films and the effects of capping layers : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 5623-5625 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: X-ray magnetic circular dichroism (XMCD) measurements on wedges of Ni grown on Cu(001) are used to investigate magnetic properties in Ni/Cu(001) ultrathin films. A sharp transition from in-plane to perpendicular magnetization is found near 7 ML, and a gradual transition back to in-plane magnetization begins near 37 ML. The critical thickness for epitaxial growth, 13 ML, is determined from a rapid rise in the coercive field versus film thickness. Both transitions in the direction of easy axis are well explained by considering the effects of the surface, shape, and the strain-induced magnetoelastic anisotropies. The critical layer thickness of 13 ML plays a critical role in understanding the transition near 37 ML. Capping the Ni wedge with 2 ML of Co increases the magnitude of the surface anisotropy, forcing the magnetization to remain in plane for thickness up to at least 18 ML. Addition of an Fe capping layer has no effect on the direction of magnetization, suggesting the importance of interface anisotropies or intermixing. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361841
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  • 3
    Electronic Resource
    Electronic Resource
    New magnetic phases of Fe on fcc Co(001) and Ni(001) : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 5629-5631 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A sequence of three distinct magnetic phases of Fe are found for growth on both fcc Co(001) and Ni(001) using x-ray magnetic circular dichroism. For Fe coverages below 5 ML the films are ferromagnetic, with the magnetic moments aligned perpendicular to the surface for growth on Ni and parallel to the surface for growth on Co. Between 5 and 11 ML the Fe films are nonferromagnetic at room temperature. Above 11 ML the Fe films are once again ferromagnetic. An identical sequence of magnetic phase transitions is known to occur for Fe growth on Cu(001). Based on this comparison and on the nearly identical lateral lattice constants of fcc Co, Ni, and Cu, we conclude that Fe growth on fcc Co(001) and Ni(001) follows the same sequence of crystalline phase transitions as Fe growth on Cu(001). © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.362263
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  • 4
    Electronic Resource
    Electronic Resource
    Element specific magnetic microscopy with x rays (invited) (abstract) : 38th Annual Conference on Magnetism and Magnetic Materials (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 6890-6890 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have used the magnetic circular x-ray dichroism (MCXD) technique to image magnetic domains with a spatial resolution of 1 μm. The experiments employed circularly polarized soft x rays near the edges of the three-dimensional (3d) transition metals Co ((approximately-equal-to)780 eV) and Ni ((approximately-equal-to)850 eV) and a photoemission microscope based on an electrostatically imaging lens system. Element specific contrast is obtained by tuning to a specific L edge resonance ("white line'') and imaging the number of secondary electrons created locally near the surface of the sample. The magnetic contrast arises from the fact that the white line intensity depends on the relative orientation of the photon spin and the local magnetization direction. The obtained contrast is remarkably large ((approximately-equal-to)20%) such that images can be recorded without background subtraction. Images taken at the L3 and L2 resonance energies give reversed contrast, as expected. Because of the long x-ray and secondary electron mean free paths, images can be recorded for buried magnetic layers which makes this new technique especially valuable for technological applications.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.356822
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  • 5
    Electronic Resource
    Electronic Resource
    Experimental investigation of dichroism sum rules for V, Cr, Mn, Fe, Co, and Ni: Influence of diffuse magnetism : The 6th joint magnetism and magnetic materials (MMM)-intermag conference (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 6462-6464 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Uncertainties in the application of the 〈Lz〉/〈Sz〉 sum rule to experimental spectra of V, Cr, Mn, Fe, Co, and Ni are discussed. An important contribution to these uncertainties is the possible presence of dichroism due to diffuse magnetic moments, which are known to exist in Fe, Co, and Ni.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358224
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  • 6
    Electronic Resource
    Electronic Resource
    Observation of x-ray magnetic circular dichroism at the Rh M2,3 edge in Co-Rh alloys : The 6th joint magnetism and magnetic materials (MMM)-intermag conference (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 6471-6473 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The M2,3 edge of Rh in Co-Rh alloys shows measurable x-ray magnetic circular dichroism. Such dichroism is not present, however, for analogous alloys of Co-Ru. The induced Ru magnetic moment, if any, is thus demonstrated to be significantly smaller than the induced Rh moment in otherwise similar Co alloys.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358227
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  • 7
    Electronic Resource
    Electronic Resource
    Enhanced magnetic moment and magnetic ordering in MnNi and MnCu surface alloys : The 6th joint magnetism and magnetic materials (MMM)-intermag conference (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 6468-6470 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Two-dimensional, ordered surface alloys of MnCu and MnNi were grown on Cu(001) and Ni(001) substrates. These surface alloys, which have structures that are not present in the bulk phase diagram, are highly corrugated with a c(2×2) periodicity. The stability of these surfaces has been predicted theoretically to be due to a gain in magnetic energy of the Mn atoms. Using a combination of soft x-ray absorption spectroscopy and x-ray magnetic circular dichroism we find that Mn is in a high-spin state and is ferromagnetically ordered in the MnNi surface alloy. MnNi surface alloys have been grown with an easy axis of magnetization perpendicular to the surface.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358226
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  • 8
    Electronic Resource
    Electronic Resource
    Photoelectron microscopy with synchrotron radiation (1988)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 853-858 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Real-time images produced by photoelectrons from metal and semiconductor samples have been generated using synchrotron radiation. A single electrostatic objective lens coupled to a two-stage image intensifier has been used to evaluate the feasibility of combined imaging and spectroscopy with photoelectrons in the ultraviolet and soft x-ray regions. Images were generated using photon energies ranging from 9 to 160 eV. The use of monochromatic synchrotron radiation provides a unique capability for generating image contrast by digital subtraction of images formed with photon energies above and below a core-level binding energy. A simple electron-optical objective lens produces images with a few microns resolution, and adequate sensitivity to image 45-eV kinetic energy electrons using bending magnet radiation. Calculations based on these experiments show that comparable resolutions are possible for combined microscopy and spectroscopy with electrons of order 100-eV kinetic energy using currently available bending magnet synchrotron radiation. Calculations for expected performance from undulator sources are presented.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1139792
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  • 9
    Electronic Resource
    Electronic Resource
    Theoretical modeling and experimental testing of a multimode optical system and energy analyzer for electron spectroscopy (1987)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 58 (1987), S. 1164-1172 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An electron-optical system and hemispherical electrostatic energy dispersing element for quantitative electron spectroscopy over a wide range of kinetic energies is described. The electron optics were modeled using several calculational techniques, in order to determine the theoretical conditions under which a fixed linear magnification could be obtained. By designing an optical system with a plane of reflection symmetry, fixed magnification focus was possible over a calculated range of retard ratios from 1/40 to 40/1. The optics can be run in two different modes, one with and one without a retarding field grid to achieve the energy retardation. Comparisons between the predictions made using the various computational methods are reported, as well as experimental verification of the actual performance of the electron optics and energy analyzer. A method is described by which the angular acceptance of the electron optics can be varied by changing the excitation potentials on the lenses. The completed system allows for the simple installation of single-channel, multichannel, and spin-polarization detectors without modification of the analyzer.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1139592
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  • 10
    Electronic Resource
    Electronic Resource
    An electron imaging approach to soft-x-ray transmission spectromicroscopy (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 737-741 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We tested a new soft-x-ray transmission spectromiscropy technique on the Aladdin storage ring at the Wisconsin Synchrotron Radiation Center. Transmitted x rays were converted with a photocathode into photoelectrons, which were subsequently electron-optically processed by an x-ray secondary electron-emission microscope producing submicron-resolution images. Test images demonstrated the excellent contrast due to the chemical differences between silicon features and a silicon nitride substrate. We also obtained x-ray transmission versus photon energy curves for microscopic specimen areas. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146851
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