ISSN:
1573-4889
Keywords:
reflectance spectroscopy
;
oxide films
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Theoretical reflectance spectra for a thin film on an infinite substrate (such as an oxide layer on a metal) have been calculated, to assess the combined effects of absorption bands, interference and surface structure on film identification and the accuracy of film thickness measurements.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00606197
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