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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 2486-2493 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Molecular beam epitaxially grown short period (001) Hg1−xCdxTe-HgTe superlattices have been systematically investigated. Several narrow well widths were chosen, e.g., 30, 35 and 40 A(ring), and the barrier widths were varied between 24 and 90 A(ring) for a particular well width. Both the well width and the total period were determined directly by means of x-ray diffraction. The well width was determined by exploiting the high reflectivity from HgTe and the low reflectivity from CdTe for the (002) Bragg reflection. Knowing the well and barrier widths we have been able to set an upper limit on the average Cd concentration of the barriers, x¯b, by annealing several superlattices and then measuring the composition of the resulting alloy. x¯b was shown to decrease exponentially with decreasing barrier width. The structure of a very short period superlattice, i.e., 31.4 A(ring), was also investigated by transmission electron microscopy, corroborating the x-ray diffraction results.
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 3420-3422 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The effects of carbon on TlBa2Ca2Cu3Ox phase formation in the TlF–Ba2Ca2Cu3Oz system were investigated by varying the carbon contents in Ba2Ca2Cu3Oz precursor powders that were mixed with TlF and reacted to form the superconducting phase. It was found that carbon induced Tl2Ba2Ca2Cu3Oy phase formation resulting in superlattices formed by c-axis intergrowths between TlBa2Ca2Cu3Ox and Tl2Ba2Ca2Cu3Oy. The superlattices were highly regular and uniform throughout the samples. While TlBa2Ca2Cu3Ox was the main phase at low carbon content (0.231 wt %), Tl2Ba2Ca2Cu3Oy became the dominant phase at high carbon content (0.472 wt %) even with a 1:2:2:3 (Tl:Ba:Ca:Cu) starting composition. © 1996 American Institute of Physics.
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 3746-3748 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new method to prepare bicrystals with well defined planar interfaces in YBa2Cu3Ox (Y123) has been developed. The bicrystal misorientation is controlled by dual seeding using Nd1+xBa2−xCu3Oy single crystals. The grain boundary plane orientation is influenced by the positioning of the seeds and by control of the temperature gradient. The macro-, meso-, and microscopic planarity of the grain boundaries has been established by optical and electron microscopy. In addition, a difference in critical current density between the low (≤10°) and the high (≥20°) misorientation angle regime of nearly two orders of magnitude has been established in a series of [001]-tilt grain boundaries. Thus, this type of grain boundary may allow a less ambiguous interpretation of the relationship between microstructure and transport properties than is possible from bicrystal thin film boundaries by eliminating the potential variations in properties associated with a varying grain boundary plane. © 1996 American Institute of Physics.
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  • 4
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Plant breeding 109 (1992), S. 0 
    ISSN: 1439-0523
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition
    Notes: Several methods have been proposed over the years to detect linkage between a marker gene and quantitative trait locus (QTL). Use of isozymes and restriction fragment length polymorphisms as genetic markers, has encouraged the development of new methods to detect linkage. We present three methods to detect linkage and two methods to measure recombination frequency (r). The three methods that detect linkage can be used when a single QTL or a tightly linked cluster of QTLs control the quantitative trait. The two methods that measure recombination frequency could not be used in the latter case because r would not be properly estimated. Procedures to calculate the additive and dominance gene effects of the QTL and the respective variances of these estimates were also presented.
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  • 5
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Journal of Photochemistry and Photobiology B: Biology 24 (1994), S. 109-116 
    ISSN: 1011-1344
    Keywords: Cationic CTAC micelle ; Photodynamic therapy of tumour ; Photosensitized oxidation of tyrosine ; Phthalocyanine
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Biology , Chemistry and Pharmacology , Medicine
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Trends in Biochemical Sciences 19 (1994), S. 279-283 
    ISSN: 0968-0004
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Biology , Chemistry and Pharmacology , Medicine
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Journal of Photochemistry and Photobiology B: Biology 22 (1994), S. 235-239 
    ISSN: 1011-1344
    Keywords: Photosensitization ; Phthalocyanine ; Superoxide radical
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Biology , Chemistry and Pharmacology , Medicine
    Type of Medium: Electronic Resource
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  • 8
    ISSN: 1432-0630
    Keywords: 61.10 ; 68.65
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Single crystals of iodine-intercalated C60 have been examined by transmission electron microscopy. Tilting series of Electron Diffraction Patterns (EDP) confirm that it has a simple hexagonal structure with c/a≈1 in accordance with the results of X-ray diffraction, which allows higher precision c/a=1.0024. Cooling and heating experiments were performed in the vacuum of the microscope to investigate the order — disorder phenomena. High-Resolution Electron Microscopy (HREM) images and electron diffraction patterns reveal that the c/2-displacement along the c-direction plays an important role in the transition from the simple hexagonal structure into the fcc structure when iodine is lost from the specimen or “vice versa”. The orientation relationship between the intercalate and the C60 structure is [01 $$\overline {\text{1}}$$ 10]h∥[1 $$\overline {\text{1}}$$ 10]fcc and (001)h∥(110)fcc. A model is proposed to interpret the features observed in EDP and HREM consistently.
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  • 9
    ISSN: 1572-9605
    Keywords: TI-1223 ; thin films ; MOCVD ; fluoride
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract Thin films of TI1Ba2Ca2Cu3O9+x have been grown on single crystal (110) LaAlO3 by a metal-organic chemical vapor deposition process employing Ba(hfa)2.mep, Ca(hfa)2.tet. and Cu(dpm)2 (hfa = hexafluoroacetylacetonate; dpm = dipivaloylmethanate; tet = tetraglyme; mep =methylethylpentaglyme) as the volatile metal sources. A subsequent phase-selective annealing procedure accomplishes thallination using TIF in a bulk oxide pellet. The resulting films are nearly phase-pure and highly oriented and contain negligible fluoride by windowless energy-dispersive x-ray measurements. The films exhibit transport measured Tc = 103 K and Jc 〉 104 A/cm2 (77 K. 0 T) and at low temperatures retain Jc 〉 105 A/cm2 (5 K, 4.5 T) as measured by magnetic hysteresis.
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  • 10
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 34 (1999), S. 3117-3125 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Carbon nitride films were grown on Si and Pt substrates by microwave plasma chemical vapor deposition (MPCVD) method. Scanning electron microscope (SEM) observations show that the films deposited on Si substrates consisted of densely populated hexagonal crystalline rods. Energy dispersive X-ray (EDX) analyses show that N/C ratios of the rods were in the range of 1.0 to 2.0 depending on deposition condition. X-ray diffraction experiments show that the films consisted of crystalline phase β-C3N4. Comparison with films grown on Pt substrate show that the main X-ray diffraction peaks of β-C3N4 are existed in films deposited on both substrate. XPS study showed that carbon and nitride atoms are covalent bounded to each other. IR results show that the film is predominantly C-N bonded. Raman measurement showed characteristic peaks of β-C3N4 in the low wave number region. Temperature dependent growth experiments show that the amount of Si3N4 in the films grown on Si substrates can be significantly reduced to negligible amount by controlling the substrate temperature.
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