Electronic Resource
Chester
:
International Union of Crystallography (IUCr)
Journal of synchrotron radiation
5 (1998), S. 705-707
ISSN:
1600-5775
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
Specular and non-specular X-ray reflectivity intensities of a (Ta/Si)60 multilayer sample were measured to characterize its interface structure. Since the multilayer has a good reflectance at its multilayer peaks, its performance as a wide-bandpass monochromator for X-ray scattering experiments of polymers has been tested.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0909049597020311
Permalink
|
Location |
Call Number |
Expected |
Availability |