Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
66 (1995), S. 4157-4160
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A general model is presented for dynamic analysis of piezoelectric elements. The detailed solution of the model is given for the first time. The previous research results are some specific cases to our model and can be deduced from our model. Using this model, one can analyze precisely the dynamic response of the mechanical system driven by piezoelectric elements. As an example, the dynamic response of the widely used scanning probe microscope scanner is calculated. The method to deal with structure damping in the piezoelectric material is also discussed and we get different results from the previous results. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145363
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