ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A far-infrared reflectivity set up has been developed for spectroscopy on highly reflective materials in a 20 T-class resistive Bitter magnet. As a first application, far-infrared reflectivity measurements on the heavy-fermion compound URu2Si2 have been performed using a silicon reflection Fabry–Pérot interferometer as a multiple reflection device. In a resonance, this Fabry–Pérot technique is one order of magnitude more sensitive than a single reflection measurement. Changes in the reflectivity as a function of magnetic field are resolved with an accuracy of 0.2% and the absolute value of the reflectivity can be obtained with an accuracy of 0.5%. With this interferometer, an excitation at about 40 cm−1 in the heavy-fermion system URu2Si2 is investigated at temperatures between 2 and 20 Kelvin and in magnetic fields up to 20 T. The excitation appears to extend to lower energies under influence of a large magnetic field. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1147530
Permalink